Loading…
Effects of electronic ballasts in fluorescent lamp lifetime
This paper approaches several topics in lifetime prediction of fluorescent lamps. An expression that relates lamp lifetime with on/off cycles is proposed. The independent variables of the model are identified with two parameters supplied to the fluorescent lamp by the ballast. The effect of differen...
Saved in:
Main Authors: | , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 3517 |
container_issue | |
container_start_page | 3512 |
container_title | |
container_volume | |
creator | Rosillo, F.G. Chivelet, N.M. Aguilera, M.E. |
description | This paper approaches several topics in lifetime prediction of fluorescent lamps. An expression that relates lamp lifetime with on/off cycles is proposed. The independent variables of the model are identified with two parameters supplied to the fluorescent lamp by the ballast. The effect of different values of on/off cycles are also assessed together with the possibility of designing accelerated test in order to quote the effect of ballast in fluorescent lamp lifetime. As an example of application of the model, it is used a simplified version in order to evaluate the influence of changes in the voltage supplied to the electronic ballast by photovoltaic systems. Finally the influence of electrode heating on cathode fall voltage at different values of lamp voltage is measured for a fluorescent lamp. |
doi_str_mv | 10.1109/IECON.2009.5415170 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_5415170</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5415170</ieee_id><sourcerecordid>5415170</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-d2bd33500201cf3398894b74e4877447811cd96e1a0214621940530f03721a913</originalsourceid><addsrcrecordid>eNpNT01LxDAQjajgsvYP6CV_oHUmmTQNnqTUdWFxLwrelrRNIJJul6Ye_PdW3IPv8j5ghvcYu0MoEME8bJt6_1oIAFMoQoUaLlhmdIUkiKhUUF7-91TJK7ZCpWSutPi4YVlKn7CAfk_Nij023rtuTnz03MVFTeMxdLy1Mdq0xOHIffwaJ5c6d5x5tMOJx-DdHAZ3y669jcllZ16z9-fmrX7Jd_vNtn7a5QG1mvNetL2UCkAAdl5KU1WGWk2OKq2Jlq7Y9aZ0aEEglQINgZLgQWqB1qBcs_u_v8E5dzhNYbDT9-E8X_4A1TVJbw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Effects of electronic ballasts in fluorescent lamp lifetime</title><source>IEEE Xplore All Conference Series</source><creator>Rosillo, F.G. ; Chivelet, N.M. ; Aguilera, M.E.</creator><creatorcontrib>Rosillo, F.G. ; Chivelet, N.M. ; Aguilera, M.E.</creatorcontrib><description>This paper approaches several topics in lifetime prediction of fluorescent lamps. An expression that relates lamp lifetime with on/off cycles is proposed. The independent variables of the model are identified with two parameters supplied to the fluorescent lamp by the ballast. The effect of different values of on/off cycles are also assessed together with the possibility of designing accelerated test in order to quote the effect of ballast in fluorescent lamp lifetime. As an example of application of the model, it is used a simplified version in order to evaluate the influence of changes in the voltage supplied to the electronic ballast by photovoltaic systems. Finally the influence of electrode heating on cathode fall voltage at different values of lamp voltage is measured for a fluorescent lamp.</description><identifier>ISSN: 1553-572X</identifier><identifier>ISBN: 9781424446483</identifier><identifier>ISBN: 1424446481</identifier><identifier>EISBN: 9781424446506</identifier><identifier>EISBN: 9781424446490</identifier><identifier>EISBN: 1424446503</identifier><identifier>EISBN: 142444649X</identifier><identifier>DOI: 10.1109/IECON.2009.5415170</identifier><language>eng</language><publisher>IEEE</publisher><subject>Coatings ; Degradation ; Electrodes ; Electronic ballasts ; Fluorescent lamps ; Life estimation ; Life testing ; Photovoltaic systems ; Telecommunications ; Voltage</subject><ispartof>2009 35th Annual Conference of IEEE Industrial Electronics, 2009, p.3512-3517</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5415170$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5415170$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rosillo, F.G.</creatorcontrib><creatorcontrib>Chivelet, N.M.</creatorcontrib><creatorcontrib>Aguilera, M.E.</creatorcontrib><title>Effects of electronic ballasts in fluorescent lamp lifetime</title><title>2009 35th Annual Conference of IEEE Industrial Electronics</title><addtitle>IECON</addtitle><description>This paper approaches several topics in lifetime prediction of fluorescent lamps. An expression that relates lamp lifetime with on/off cycles is proposed. The independent variables of the model are identified with two parameters supplied to the fluorescent lamp by the ballast. The effect of different values of on/off cycles are also assessed together with the possibility of designing accelerated test in order to quote the effect of ballast in fluorescent lamp lifetime. As an example of application of the model, it is used a simplified version in order to evaluate the influence of changes in the voltage supplied to the electronic ballast by photovoltaic systems. Finally the influence of electrode heating on cathode fall voltage at different values of lamp voltage is measured for a fluorescent lamp.</description><subject>Coatings</subject><subject>Degradation</subject><subject>Electrodes</subject><subject>Electronic ballasts</subject><subject>Fluorescent lamps</subject><subject>Life estimation</subject><subject>Life testing</subject><subject>Photovoltaic systems</subject><subject>Telecommunications</subject><subject>Voltage</subject><issn>1553-572X</issn><isbn>9781424446483</isbn><isbn>1424446481</isbn><isbn>9781424446506</isbn><isbn>9781424446490</isbn><isbn>1424446503</isbn><isbn>142444649X</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2009</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpNT01LxDAQjajgsvYP6CV_oHUmmTQNnqTUdWFxLwrelrRNIJJul6Ye_PdW3IPv8j5ghvcYu0MoEME8bJt6_1oIAFMoQoUaLlhmdIUkiKhUUF7-91TJK7ZCpWSutPi4YVlKn7CAfk_Nij023rtuTnz03MVFTeMxdLy1Mdq0xOHIffwaJ5c6d5x5tMOJx-DdHAZ3y669jcllZ16z9-fmrX7Jd_vNtn7a5QG1mvNetL2UCkAAdl5KU1WGWk2OKq2Jlq7Y9aZ0aEEglQINgZLgQWqB1qBcs_u_v8E5dzhNYbDT9-E8X_4A1TVJbw</recordid><startdate>200911</startdate><enddate>200911</enddate><creator>Rosillo, F.G.</creator><creator>Chivelet, N.M.</creator><creator>Aguilera, M.E.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200911</creationdate><title>Effects of electronic ballasts in fluorescent lamp lifetime</title><author>Rosillo, F.G. ; Chivelet, N.M. ; Aguilera, M.E.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-d2bd33500201cf3398894b74e4877447811cd96e1a0214621940530f03721a913</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2009</creationdate><topic>Coatings</topic><topic>Degradation</topic><topic>Electrodes</topic><topic>Electronic ballasts</topic><topic>Fluorescent lamps</topic><topic>Life estimation</topic><topic>Life testing</topic><topic>Photovoltaic systems</topic><topic>Telecommunications</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Rosillo, F.G.</creatorcontrib><creatorcontrib>Chivelet, N.M.</creatorcontrib><creatorcontrib>Aguilera, M.E.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rosillo, F.G.</au><au>Chivelet, N.M.</au><au>Aguilera, M.E.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Effects of electronic ballasts in fluorescent lamp lifetime</atitle><btitle>2009 35th Annual Conference of IEEE Industrial Electronics</btitle><stitle>IECON</stitle><date>2009-11</date><risdate>2009</risdate><spage>3512</spage><epage>3517</epage><pages>3512-3517</pages><issn>1553-572X</issn><isbn>9781424446483</isbn><isbn>1424446481</isbn><eisbn>9781424446506</eisbn><eisbn>9781424446490</eisbn><eisbn>1424446503</eisbn><eisbn>142444649X</eisbn><abstract>This paper approaches several topics in lifetime prediction of fluorescent lamps. An expression that relates lamp lifetime with on/off cycles is proposed. The independent variables of the model are identified with two parameters supplied to the fluorescent lamp by the ballast. The effect of different values of on/off cycles are also assessed together with the possibility of designing accelerated test in order to quote the effect of ballast in fluorescent lamp lifetime. As an example of application of the model, it is used a simplified version in order to evaluate the influence of changes in the voltage supplied to the electronic ballast by photovoltaic systems. Finally the influence of electrode heating on cathode fall voltage at different values of lamp voltage is measured for a fluorescent lamp.</abstract><pub>IEEE</pub><doi>10.1109/IECON.2009.5415170</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1553-572X |
ispartof | 2009 35th Annual Conference of IEEE Industrial Electronics, 2009, p.3512-3517 |
issn | 1553-572X |
language | eng |
recordid | cdi_ieee_primary_5415170 |
source | IEEE Xplore All Conference Series |
subjects | Coatings Degradation Electrodes Electronic ballasts Fluorescent lamps Life estimation Life testing Photovoltaic systems Telecommunications Voltage |
title | Effects of electronic ballasts in fluorescent lamp lifetime |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T19%3A28%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Effects%20of%20electronic%20ballasts%20in%20fluorescent%20lamp%20lifetime&rft.btitle=2009%2035th%20Annual%20Conference%20of%20IEEE%20Industrial%20Electronics&rft.au=Rosillo,%20F.G.&rft.date=2009-11&rft.spage=3512&rft.epage=3517&rft.pages=3512-3517&rft.issn=1553-572X&rft.isbn=9781424446483&rft.isbn_list=1424446481&rft_id=info:doi/10.1109/IECON.2009.5415170&rft.eisbn=9781424446506&rft.eisbn_list=9781424446490&rft.eisbn_list=1424446503&rft.eisbn_list=142444649X&rft_dat=%3Cieee_CHZPO%3E5415170%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-d2bd33500201cf3398894b74e4877447811cd96e1a0214621940530f03721a913%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5415170&rfr_iscdi=true |