Bit Patterning in SOAs: Statistical Characterization Through Multicanonical Monte Carlo Simulations

We present a simulation tool based on the Multicanonical Monte Carlo (MMC) method to characterize the statistical properties of bit patterning in semiconductor optical amplifiers (SOAs). Our tool estimates the conditional probability density functions (PDFs) of marks and spaces of the received signa...

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Bibliographic Details
Published in:IEEE journal of quantum electronics 2010-04, Vol.46 (4), p.570-578
Main Authors: Ghazisaeidi, A., Vacondio, F., Bononi, A., Rusch, L.A.
Format: Article
Language:English
Subjects:
BER
Bit error rate
Computer simulation
Fiber nonlinear optics
Intersymbol interference
ISI
MMC
modeling
Monte Carlo methods
Optical fiber communication
Optical filters
Optical noise
Optical receivers
Optical saturation
Optical signal processing
Patterning
Probability density functions
Quantum electronics
Sampling
Semiconductor optical amplifiers
SOA
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Description
Summary:We present a simulation tool based on the Multicanonical Monte Carlo (MMC) method to characterize the statistical properties of bit patterning in semiconductor optical amplifiers (SOAs). Our tool estimates the conditional probability density functions (PDFs) of marks and spaces of the received signal. We introduce an experimental technique to directly measure the conditional PDFs of the received marks and spaces using a high bandwidth sampling scope. We demonstrate that predictions from our simulation tool match the experimental data. We measure the bit error rate (BER) of a SOA-based preamplified receiver, where the SOA operates in the nonlinear regime, and demonstrate that our simulation tool can predict the measured BER.
ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2009.2029545