Non-Volatile EEPROM Cells for Analog Circuit Calibration

This paper presents an experimental characterization of floating-gate devices to be used as variable threshold transistors exploitable for trimming analog circuits. The presented data show that good accuracy can be achieved in circuit trimming, but also that the analog characteristics of floating-ga...

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Bibliographic Details
Main Authors: Lanzoni, M., Tondi, G., Galbiati, P., Ricco, B.
Format: Conference Proceeding
Language:English
Subjects:
Aging
Analog circuits
Calibration
CMOS technology
EPROM
Operational amplifiers
Pulse measurements
Threshold voltage
Transconductance
Voltage control
Online Access:Request full text
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Summary:This paper presents an experimental characterization of floating-gate devices to be used as variable threshold transistors exploitable for trimming analog circuits. The presented data show that good accuracy can be achieved in circuit trimming, but also that the analog characteristics of floating-gate devices are inherently worse than those of standard transistors fabricated with the same technology.