Simiple Model for Semiconductor Laser End Facet Reflectivity

The mode reflectivity of narrow stripe double heterostructure semiconductor laser is evaluated using a simplified approach. It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. The method allows to compute the reflectivity by the evaluation of...

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Bibliographic Details
Main Authors: Bava, Gian Paolo, Bianco, Andrea, Montrosset, Ivo
Format: Conference Proceeding
Language:English
Subjects:
Fourier transforms
Laser modes
Mirrors
Optical reflection
Reflectivity
Semiconductor lasers
Semiconductor waveguides
Strips
Waveguide lasers
Waveguide transitions
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Summary:The mode reflectivity of narrow stripe double heterostructure semiconductor laser is evaluated using a simplified approach. It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. The method allows to compute the reflectivity by the evaluation of an integral in the spectral domain and to obtain a closed form anlytical expression for the radiation pattern.