Simiple Model for Semiconductor Laser End Facet Reflectivity

The mode reflectivity of narrow stripe double heterostructure semiconductor laser is evaluated using a simplified approach. It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. The method allows to compute the reflectivity by the evaluation of...

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Main Authors: Bava, Gian Paolo, Bianco, Andrea, Montrosset, Ivo
Format: Conference Proceeding
Language:English
Subjects:
Fourier transforms
Laser modes
Mirrors
Optical reflection
Reflectivity
Semiconductor lasers
Semiconductor waveguides
Strips
Waveguide lasers
Waveguide transitions
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creator Bava, Gian Paolo
Bianco, Andrea
Montrosset, Ivo
description The mode reflectivity of narrow stripe double heterostructure semiconductor laser is evaluated using a simplified approach. It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. The method allows to compute the reflectivity by the evaluation of an integral in the spectral domain and to obtain a closed form anlytical expression for the radiation pattern.
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It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. 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It is based on a mode matching technique in the Fourier Transform domain for a suitable equivalent structure. The method allows to compute the reflectivity by the evaluation of an integral in the spectral domain and to obtain a closed form anlytical expression for the radiation pattern.</abstract><pub>IEEE</pub><tpages>4</tpages></addata></record>
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identifier ISBN: 0444704779
ispartof ESSDERC '87: 17th European Solid State Device Research Conference, 1987, p.1029-1032
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language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Fourier transforms
Laser modes
Mirrors
Optical reflection
Reflectivity
Semiconductor lasers
Semiconductor waveguides
Strips
Waveguide lasers
Waveguide transitions
title Simiple Model for Semiconductor Laser End Facet Reflectivity
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