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AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST
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creator | Hutchinson, T.F. |
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doi_str_mv | 10.1109/TDC.1996.547596 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_547596</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>547596</ieee_id><sourcerecordid>547596</sourcerecordid><originalsourceid>FETCH-LOGICAL-i104t-96fe60bac7c1f95173706d3f784437cc485b1b4b69d32d083a03be1b49d8525f3</originalsourceid><addsrcrecordid>eNotj09Lw0AUxBdEsNSchZ72CyTuy9t_7xjW1AZqFuz2XLLJLkQUpPHitzdQh4GBOfyYYewJRAUg6Dm8uAqIdKWkUaTvWEHGitWIqq71AyuW5UOskkrVCjYMmnPwb03ofM_9nodDy5v-1HEHQJUsVxZw5_u-dcG_89CewiO7z8Pnkor_3LLzvg3uUB79a-eaYzmDkD8l6Zy0iMNoRsikwKAResJsrJRoxlFaFSHKqGnCehIWB4ExrQ1Ndp2Wcct2N-6cUrp8X-ev4fp7uf3CPzxBO7g</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Hutchinson, T.F.</creator><creatorcontrib>Hutchinson, T.F.</creatorcontrib><identifier>ISBN: 9780780335226</identifier><identifier>ISBN: 0780335228</identifier><identifier>DOI: 10.1109/TDC.1996.547596</identifier><language>eng</language><publisher>IEEE</publisher><subject>Accelerated aging ; Automatic testing ; Automation ; Conductors ; Connectors ; Current measurement ; Electrical resistance measurement ; Relays ; Resistance heating ; Temperature</subject><ispartof>Proceedings of 1996 Transmission and Distribution Conference and Exposition, 1996, p.700</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/547596$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/547596$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Hutchinson, T.F.</creatorcontrib><title>AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST</title><title>Proceedings of 1996 Transmission and Distribution Conference and Exposition</title><addtitle>TDC</addtitle><subject>Accelerated aging</subject><subject>Automatic testing</subject><subject>Automation</subject><subject>Conductors</subject><subject>Connectors</subject><subject>Current measurement</subject><subject>Electrical resistance measurement</subject><subject>Relays</subject><subject>Resistance heating</subject><subject>Temperature</subject><isbn>9780780335226</isbn><isbn>0780335228</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1996</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj09Lw0AUxBdEsNSchZ72CyTuy9t_7xjW1AZqFuz2XLLJLkQUpPHitzdQh4GBOfyYYewJRAUg6Dm8uAqIdKWkUaTvWEHGitWIqq71AyuW5UOskkrVCjYMmnPwb03ofM_9nodDy5v-1HEHQJUsVxZw5_u-dcG_89CewiO7z8Pnkor_3LLzvg3uUB79a-eaYzmDkD8l6Zy0iMNoRsikwKAResJsrJRoxlFaFSHKqGnCehIWB4ExrQ1Ndp2Wcct2N-6cUrp8X-ev4fp7uf3CPzxBO7g</recordid><startdate>1996</startdate><enddate>1996</enddate><creator>Hutchinson, T.F.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1996</creationdate><title>AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST</title><author>Hutchinson, T.F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-96fe60bac7c1f95173706d3f784437cc485b1b4b69d32d083a03be1b49d8525f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1996</creationdate><topic>Accelerated aging</topic><topic>Automatic testing</topic><topic>Automation</topic><topic>Conductors</topic><topic>Connectors</topic><topic>Current measurement</topic><topic>Electrical resistance measurement</topic><topic>Relays</topic><topic>Resistance heating</topic><topic>Temperature</topic><toplevel>online_resources</toplevel><creatorcontrib>Hutchinson, T.F.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hutchinson, T.F.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST</atitle><btitle>Proceedings of 1996 Transmission and Distribution Conference and Exposition</btitle><stitle>TDC</stitle><date>1996</date><risdate>1996</risdate><spage>700</spage><pages>700-</pages><isbn>9780780335226</isbn><isbn>0780335228</isbn><pub>IEEE</pub><doi>10.1109/TDC.1996.547596</doi></addata></record> |
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identifier | ISBN: 9780780335226 |
ispartof | Proceedings of 1996 Transmission and Distribution Conference and Exposition, 1996, p.700 |
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language | eng |
recordid | cdi_ieee_primary_547596 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Accelerated aging Automatic testing Automation Conductors Connectors Current measurement Electrical resistance measurement Relays Resistance heating Temperature |
title | AUTOMATION OF THE ANSI C119.4-1991 CONNECTOR TEST |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-01T06%3A42%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=AUTOMATION%20OF%20THE%20ANSI%20C119.4-1991%20CONNECTOR%20TEST&rft.btitle=Proceedings%20of%201996%20Transmission%20and%20Distribution%20Conference%20and%20Exposition&rft.au=Hutchinson,%20T.F.&rft.date=1996&rft.spage=700&rft.pages=700-&rft.isbn=9780780335226&rft.isbn_list=0780335228&rft_id=info:doi/10.1109/TDC.1996.547596&rft_dat=%3Cieee_6IE%3E547596%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i104t-96fe60bac7c1f95173706d3f784437cc485b1b4b69d32d083a03be1b49d8525f3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=547596&rfr_iscdi=true |