Sensitivity matrix analysis for contactless electrical conductivity imaging

In this study, the sensitivity matrix for contactless electrical conductivity imaging was analyzed. Images of conductivity distribution were obtained using the reconstruction algorithms. To analyze the sensitivity matrix, a homogeneous volume conductor with 0.2 S/m conductivity and a 7×7 grid of coi...

Full description

Saved in:
Bibliographic Details
Main Authors: Zengin, Reyhan, Gençer, Nevzat G
Format: Conference Proceeding
Language:English
Subjects:
Coils
Conductivity
Conductors
Contacts
Gradient methods
Image analysis
Inverse problems
Reconstruction algorithms
Transmitters
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 4
container_issue
container_start_page 1
container_title
container_volume
creator Zengin, Reyhan
Gençer, Nevzat G
description In this study, the sensitivity matrix for contactless electrical conductivity imaging was analyzed. Images of conductivity distribution were obtained using the reconstruction algorithms. To analyze the sensitivity matrix, a homogeneous volume conductor with 0.2 S/m conductivity and a 7×7 grid of coil pairs were chosen. Sensitivity distributions for all receiver- transmitter coils were imaged. To image conductivity distribution, forward problem with different conductivity distributions was solved. These results were used as data for inverse problem solution. Images of conductivity distributions were obtained by using Steepest Descent Method, Conjugate Gradient Method and Tikhonov Regularization Method. The best image was obtained using Steepest Descent Method with 2.5% error.
doi_str_mv 10.1109/BIYOMUT.2010.5479819
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_5479819</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5479819</ieee_id><sourcerecordid>5479819</sourcerecordid><originalsourceid>FETCH-ieee_primary_54798193</originalsourceid><addsrcrecordid>eNp9TrsKwjAAjIjgq1-gQ35ATdLEtquiKCIO1sGphJiWSJpKE8X-vREKbt5y3AsOgClGc4xRsljtr6fjJZ0T5B1GoyTGSQcMMSWULsMYs-5PoKgPAmvvyIMyQigbgMNZGquceinXwJK7Wr0hN1w3VlmYVzUUlXFcOC2thVJL4RuC6699e4p2p0peKFOMQS_n2sqg5RGYbDfpejdTUsrsUfta3WTtyfB_-gHccUGH</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Sensitivity matrix analysis for contactless electrical conductivity imaging</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Zengin, Reyhan ; Gençer, Nevzat G</creator><creatorcontrib>Zengin, Reyhan ; Gençer, Nevzat G</creatorcontrib><description>In this study, the sensitivity matrix for contactless electrical conductivity imaging was analyzed. Images of conductivity distribution were obtained using the reconstruction algorithms. To analyze the sensitivity matrix, a homogeneous volume conductor with 0.2 S/m conductivity and a 7×7 grid of coil pairs were chosen. Sensitivity distributions for all receiver- transmitter coils were imaged. To image conductivity distribution, forward problem with different conductivity distributions was solved. These results were used as data for inverse problem solution. Images of conductivity distributions were obtained by using Steepest Descent Method, Conjugate Gradient Method and Tikhonov Regularization Method. The best image was obtained using Steepest Descent Method with 2.5% error.</description><identifier>ISBN: 1424463807</identifier><identifier>ISBN: 9781424463800</identifier><identifier>EISBN: 1424463815</identifier><identifier>EISBN: 9781424463817</identifier><identifier>EISBN: 9781424463824</identifier><identifier>EISBN: 1424463823</identifier><identifier>DOI: 10.1109/BIYOMUT.2010.5479819</identifier><language>eng</language><publisher>IEEE</publisher><subject>Coils ; Conductivity ; Conductors ; Contacts ; Gradient methods ; Image analysis ; Inverse problems ; Reconstruction algorithms ; Transmitters</subject><ispartof>2010 15th National Biomedical Engineering Meeting, 2010, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5479819$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5479819$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zengin, Reyhan</creatorcontrib><creatorcontrib>Gençer, Nevzat G</creatorcontrib><title>Sensitivity matrix analysis for contactless electrical conductivity imaging</title><title>2010 15th National Biomedical Engineering Meeting</title><addtitle>BIYOMUT</addtitle><description>In this study, the sensitivity matrix for contactless electrical conductivity imaging was analyzed. Images of conductivity distribution were obtained using the reconstruction algorithms. To analyze the sensitivity matrix, a homogeneous volume conductor with 0.2 S/m conductivity and a 7×7 grid of coil pairs were chosen. Sensitivity distributions for all receiver- transmitter coils were imaged. To image conductivity distribution, forward problem with different conductivity distributions was solved. These results were used as data for inverse problem solution. Images of conductivity distributions were obtained by using Steepest Descent Method, Conjugate Gradient Method and Tikhonov Regularization Method. The best image was obtained using Steepest Descent Method with 2.5% error.</description><subject>Coils</subject><subject>Conductivity</subject><subject>Conductors</subject><subject>Contacts</subject><subject>Gradient methods</subject><subject>Image analysis</subject><subject>Inverse problems</subject><subject>Reconstruction algorithms</subject><subject>Transmitters</subject><isbn>1424463807</isbn><isbn>9781424463800</isbn><isbn>1424463815</isbn><isbn>9781424463817</isbn><isbn>9781424463824</isbn><isbn>1424463823</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9TrsKwjAAjIjgq1-gQ35ATdLEtquiKCIO1sGphJiWSJpKE8X-vREKbt5y3AsOgClGc4xRsljtr6fjJZ0T5B1GoyTGSQcMMSWULsMYs-5PoKgPAmvvyIMyQigbgMNZGquceinXwJK7Wr0hN1w3VlmYVzUUlXFcOC2thVJL4RuC6699e4p2p0peKFOMQS_n2sqg5RGYbDfpejdTUsrsUfta3WTtyfB_-gHccUGH</recordid><startdate>201004</startdate><enddate>201004</enddate><creator>Zengin, Reyhan</creator><creator>Gençer, Nevzat G</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201004</creationdate><title>Sensitivity matrix analysis for contactless electrical conductivity imaging</title><author>Zengin, Reyhan ; Gençer, Nevzat G</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_54798193</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Coils</topic><topic>Conductivity</topic><topic>Conductors</topic><topic>Contacts</topic><topic>Gradient methods</topic><topic>Image analysis</topic><topic>Inverse problems</topic><topic>Reconstruction algorithms</topic><topic>Transmitters</topic><toplevel>online_resources</toplevel><creatorcontrib>Zengin, Reyhan</creatorcontrib><creatorcontrib>Gençer, Nevzat G</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zengin, Reyhan</au><au>Gençer, Nevzat G</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Sensitivity matrix analysis for contactless electrical conductivity imaging</atitle><btitle>2010 15th National Biomedical Engineering Meeting</btitle><stitle>BIYOMUT</stitle><date>2010-04</date><risdate>2010</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><isbn>1424463807</isbn><isbn>9781424463800</isbn><eisbn>1424463815</eisbn><eisbn>9781424463817</eisbn><eisbn>9781424463824</eisbn><eisbn>1424463823</eisbn><abstract>In this study, the sensitivity matrix for contactless electrical conductivity imaging was analyzed. Images of conductivity distribution were obtained using the reconstruction algorithms. To analyze the sensitivity matrix, a homogeneous volume conductor with 0.2 S/m conductivity and a 7×7 grid of coil pairs were chosen. Sensitivity distributions for all receiver- transmitter coils were imaged. To image conductivity distribution, forward problem with different conductivity distributions was solved. These results were used as data for inverse problem solution. Images of conductivity distributions were obtained by using Steepest Descent Method, Conjugate Gradient Method and Tikhonov Regularization Method. The best image was obtained using Steepest Descent Method with 2.5% error.</abstract><pub>IEEE</pub><doi>10.1109/BIYOMUT.2010.5479819</doi></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 1424463807
ispartof 2010 15th National Biomedical Engineering Meeting, 2010, p.1-4
issn
language eng
recordid cdi_ieee_primary_5479819
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Coils
Conductivity
Conductors
Contacts
Gradient methods
Image analysis
Inverse problems
Reconstruction algorithms
Transmitters
title Sensitivity matrix analysis for contactless electrical conductivity imaging
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T09%3A56%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Sensitivity%20matrix%20analysis%20for%20contactless%20electrical%20conductivity%20imaging&rft.btitle=2010%2015th%20National%20Biomedical%20Engineering%20Meeting&rft.au=Zengin,%20Reyhan&rft.date=2010-04&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.isbn=1424463807&rft.isbn_list=9781424463800&rft_id=info:doi/10.1109/BIYOMUT.2010.5479819&rft.eisbn=1424463815&rft.eisbn_list=9781424463817&rft.eisbn_list=9781424463824&rft.eisbn_list=1424463823&rft_dat=%3Cieee_6IE%3E5479819%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_54798193%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5479819&rfr_iscdi=true