Verification of performance of commercial LCR meters

Four high-accuracy LCR meters have been compared with the use of Metrosert and MIKES impedance standards. Specifications of LCR meters have been verified at frequency of 1 kHz for the resistance range from 1 Ω to 100 kΩ, for the capacitances in the range from 100 pF to 1 μF and for 100 mH inductor....

Full description

Saved in:
Bibliographic Details
Main Authors: Pokatilov, A, Satrapinski, A, Kubarsepp, T, Martens, O
Format: Conference Proceeding
Language:English
Subjects:
Calibration
Capacitance measurement
Electrical resistance measurement
Frequency
Impedance
Inductance
Instruments
Measurement standards
Resistors
Testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 409
container_issue
container_start_page 408
container_title
container_volume
creator Pokatilov, A
Satrapinski, A
Kubarsepp, T
Martens, O
description Four high-accuracy LCR meters have been compared with the use of Metrosert and MIKES impedance standards. Specifications of LCR meters have been verified at frequency of 1 kHz for the resistance range from 1 Ω to 100 kΩ, for the capacitances in the range from 100 pF to 1 μF and for 100 mH inductor. The performance of LCR meters have been compared also at frequencies from 1 kHz to 1 MHz with ac resistors of different types, at 1 kHz and 100 kHz with 100 pF - 1 μF capacitance standards, and at 1 kHz with 300 μH - 300 mH inductance standards. Results of measurements presented in this summary confirm the specified uncertainty of the tested LCR meters.
doi_str_mv 10.1109/CPEM.2010.5545242
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_5545242</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5545242</ieee_id><sourcerecordid>5545242</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-5a9ff0a3c567c0b46e5d12b8e49b6147cb7068193586e607c066e6114b45ed3c3</originalsourceid><addsrcrecordid>eNpVkEtLw0AUhccXGGp-gLjJH0i9d3LntZRQHxBRpLgtk-kdGGmaMunGf2_Ebjybw-EcvsUR4hZhiQjuvn1fvS4lzFEpUpLkmSidsUiSSBtn9LkoJGqoAQ1e_OuUvBQFKOtqJKuuRTlNXzBrxqCBQtAn5xRT8Mc07qsxVgfOccyD3wf-jWEcBs4h-V3VtR_VwEfO0424in43cXnyhVg_rtbtc929Pb20D12dHBxr5V2M4JugtAnQk2a1RdlbJtdrJBN6A9qia5TVrGHe6NkRqSfF2yY0C3H3h03MvDnkNPj8vTld0PwABfxJNw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Verification of performance of commercial LCR meters</title><source>IEEE Xplore All Conference Series</source><creator>Pokatilov, A ; Satrapinski, A ; Kubarsepp, T ; Martens, O</creator><creatorcontrib>Pokatilov, A ; Satrapinski, A ; Kubarsepp, T ; Martens, O</creatorcontrib><description>Four high-accuracy LCR meters have been compared with the use of Metrosert and MIKES impedance standards. Specifications of LCR meters have been verified at frequency of 1 kHz for the resistance range from 1 Ω to 100 kΩ, for the capacitances in the range from 100 pF to 1 μF and for 100 mH inductor. The performance of LCR meters have been compared also at frequencies from 1 kHz to 1 MHz with ac resistors of different types, at 1 kHz and 100 kHz with 100 pF - 1 μF capacitance standards, and at 1 kHz with 300 μH - 300 mH inductance standards. Results of measurements presented in this summary confirm the specified uncertainty of the tested LCR meters.</description><identifier>ISSN: 0589-1485</identifier><identifier>ISBN: 9781424467952</identifier><identifier>ISBN: 1424467950</identifier><identifier>EISSN: 2160-0171</identifier><identifier>EISBN: 9781424467976</identifier><identifier>EISBN: 1424467977</identifier><identifier>EISBN: 9781424467969</identifier><identifier>EISBN: 1424467969</identifier><identifier>DOI: 10.1109/CPEM.2010.5545242</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Capacitance measurement ; Electrical resistance measurement ; Frequency ; Impedance ; Inductance ; Instruments ; Measurement standards ; Resistors ; Testing</subject><ispartof>CPEM 2010, 2010, p.408-409</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5545242$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5545242$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Pokatilov, A</creatorcontrib><creatorcontrib>Satrapinski, A</creatorcontrib><creatorcontrib>Kubarsepp, T</creatorcontrib><creatorcontrib>Martens, O</creatorcontrib><title>Verification of performance of commercial LCR meters</title><title>CPEM 2010</title><addtitle>CPEM</addtitle><description>Four high-accuracy LCR meters have been compared with the use of Metrosert and MIKES impedance standards. Specifications of LCR meters have been verified at frequency of 1 kHz for the resistance range from 1 Ω to 100 kΩ, for the capacitances in the range from 100 pF to 1 μF and for 100 mH inductor. The performance of LCR meters have been compared also at frequencies from 1 kHz to 1 MHz with ac resistors of different types, at 1 kHz and 100 kHz with 100 pF - 1 μF capacitance standards, and at 1 kHz with 300 μH - 300 mH inductance standards. Results of measurements presented in this summary confirm the specified uncertainty of the tested LCR meters.</description><subject>Calibration</subject><subject>Capacitance measurement</subject><subject>Electrical resistance measurement</subject><subject>Frequency</subject><subject>Impedance</subject><subject>Inductance</subject><subject>Instruments</subject><subject>Measurement standards</subject><subject>Resistors</subject><subject>Testing</subject><issn>0589-1485</issn><issn>2160-0171</issn><isbn>9781424467952</isbn><isbn>1424467950</isbn><isbn>9781424467976</isbn><isbn>1424467977</isbn><isbn>9781424467969</isbn><isbn>1424467969</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpVkEtLw0AUhccXGGp-gLjJH0i9d3LntZRQHxBRpLgtk-kdGGmaMunGf2_Ebjybw-EcvsUR4hZhiQjuvn1fvS4lzFEpUpLkmSidsUiSSBtn9LkoJGqoAQ1e_OuUvBQFKOtqJKuuRTlNXzBrxqCBQtAn5xRT8Mc07qsxVgfOccyD3wf-jWEcBs4h-V3VtR_VwEfO0424in43cXnyhVg_rtbtc929Pb20D12dHBxr5V2M4JugtAnQk2a1RdlbJtdrJBN6A9qia5TVrGHe6NkRqSfF2yY0C3H3h03MvDnkNPj8vTld0PwABfxJNw</recordid><startdate>201006</startdate><enddate>201006</enddate><creator>Pokatilov, A</creator><creator>Satrapinski, A</creator><creator>Kubarsepp, T</creator><creator>Martens, O</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201006</creationdate><title>Verification of performance of commercial LCR meters</title><author>Pokatilov, A ; Satrapinski, A ; Kubarsepp, T ; Martens, O</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-5a9ff0a3c567c0b46e5d12b8e49b6147cb7068193586e607c066e6114b45ed3c3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Calibration</topic><topic>Capacitance measurement</topic><topic>Electrical resistance measurement</topic><topic>Frequency</topic><topic>Impedance</topic><topic>Inductance</topic><topic>Instruments</topic><topic>Measurement standards</topic><topic>Resistors</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Pokatilov, A</creatorcontrib><creatorcontrib>Satrapinski, A</creatorcontrib><creatorcontrib>Kubarsepp, T</creatorcontrib><creatorcontrib>Martens, O</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pokatilov, A</au><au>Satrapinski, A</au><au>Kubarsepp, T</au><au>Martens, O</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Verification of performance of commercial LCR meters</atitle><btitle>CPEM 2010</btitle><stitle>CPEM</stitle><date>2010-06</date><risdate>2010</risdate><spage>408</spage><epage>409</epage><pages>408-409</pages><issn>0589-1485</issn><eissn>2160-0171</eissn><isbn>9781424467952</isbn><isbn>1424467950</isbn><eisbn>9781424467976</eisbn><eisbn>1424467977</eisbn><eisbn>9781424467969</eisbn><eisbn>1424467969</eisbn><abstract>Four high-accuracy LCR meters have been compared with the use of Metrosert and MIKES impedance standards. Specifications of LCR meters have been verified at frequency of 1 kHz for the resistance range from 1 Ω to 100 kΩ, for the capacitances in the range from 100 pF to 1 μF and for 100 mH inductor. The performance of LCR meters have been compared also at frequencies from 1 kHz to 1 MHz with ac resistors of different types, at 1 kHz and 100 kHz with 100 pF - 1 μF capacitance standards, and at 1 kHz with 300 μH - 300 mH inductance standards. Results of measurements presented in this summary confirm the specified uncertainty of the tested LCR meters.</abstract><pub>IEEE</pub><doi>10.1109/CPEM.2010.5545242</doi><tpages>2</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0589-1485
ispartof CPEM 2010, 2010, p.408-409
issn 0589-1485
2160-0171
language eng
recordid cdi_ieee_primary_5545242
source IEEE Xplore All Conference Series
subjects Calibration
Capacitance measurement
Electrical resistance measurement
Frequency
Impedance
Inductance
Instruments
Measurement standards
Resistors
Testing
title Verification of performance of commercial LCR meters
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T11%3A16%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Verification%20of%20performance%20of%20commercial%20LCR%20meters&rft.btitle=CPEM%202010&rft.au=Pokatilov,%20A&rft.date=2010-06&rft.spage=408&rft.epage=409&rft.pages=408-409&rft.issn=0589-1485&rft.eissn=2160-0171&rft.isbn=9781424467952&rft.isbn_list=1424467950&rft_id=info:doi/10.1109/CPEM.2010.5545242&rft.eisbn=9781424467976&rft.eisbn_list=1424467977&rft.eisbn_list=9781424467969&rft.eisbn_list=1424467969&rft_dat=%3Cieee_CHZPO%3E5545242%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-5a9ff0a3c567c0b46e5d12b8e49b6147cb7068193586e607c066e6114b45ed3c3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5545242&rfr_iscdi=true