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Results of X-band electronically scanned array using an overlapped subarray architecture
The measured results from an X-band electronically scanned array using an overlapped subarray architecture are presented. The 2D architecture uses a 12×12 element subarray with 3 to 1 overlapping. The active electronic scanned array is a receive only implementation consisting of switch, low noise am...
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Main Authors: | , , , |
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Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
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Summary: | The measured results from an X-band electronically scanned array using an overlapped subarray architecture are presented. The 2D architecture uses a 12×12 element subarray with 3 to 1 overlapping. The active electronic scanned array is a receive only implementation consisting of switch, low noise amplifier, phase shifter and attenuator. Measured far-field patterns and excitation at the aperture using near-field scanner demonstrates desired design goals of a 20 degree sector beam with low sidelobes. Finally, the scan performance of the sector subarray beam is measured at 20 and 40 degrees. A three tile implementation is constructed and measured. |
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DOI: | 10.1109/ARRAY.2010.5613285 |