Characteristics of application of impulse reflectometry in investigation of ultra-wideband circuits

Features of impulse reflectometry of the sub-nanosecond range are considered. The influence of parameters of a probing signal in the ultrabroadband nonuniform systems on the results of measurements is analyzed. An algorithm of processing of measurement data that allows accounting of the shape of the...

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Main Authors: Berdin, S A, Karelin, S Y, Korenev, V G, Mukhin, V S, Magda, I I, Naboka, A M, Soshenko, V A
Format: Conference Proceeding
Language:English
Subjects:
Data processing
Electronic mail
Impedance
Reflection
Reflectometry
Shape
Ultra wideband technology
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creator Berdin, S A
Karelin, S Y
Korenev, V G
Mukhin, V S
Magda, I I
Naboka, A M
Soshenko, V A
description Features of impulse reflectometry of the sub-nanosecond range are considered. The influence of parameters of a probing signal in the ultrabroadband nonuniform systems on the results of measurements is analyzed. An algorithm of processing of measurement data that allows accounting of the shape of the probing signal and numerous reflections, originating from nonuniform systems, is proposed.
doi_str_mv 10.1109/CRMICO.2010.5632411
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Data processing
Electronic mail
Impedance
Reflection
Reflectometry
Shape
Ultra wideband technology
title Characteristics of application of impulse reflectometry in investigation of ultra-wideband circuits
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