Loading…
Comparison between Agilent and National Instruments functional test systems
This paper presents two test systems, the first with Agilent equipments and the second with National Instruments equipments. A comparison will be made about the characteristics of each. In each test systems will be presented the three main equipments which are compulsory for a functional test system...
Saved in:
Main Authors: | , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Citations: | Items that cite this one |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c138t-aa75fd34f356ca7ea9e4f99b17c4f0afd2648b08a2afbc04cb17b7e14b6cd8c63 |
---|---|
cites | |
container_end_page | 92 |
container_issue | |
container_start_page | 87 |
container_title | |
container_volume | |
creator | Szabo, Roland Gontean, A Ioan Lie Babaita, Mircea |
description | This paper presents two test systems, the first with Agilent equipments and the second with National Instruments equipments. A comparison will be made about the characteristics of each. In each test systems will be presented the three main equipments which are compulsory for a functional test system: power supply, multimeter and function generator. |
doi_str_mv | 10.1109/SISY.2010.5647227 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_5647227</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5647227</ieee_id><sourcerecordid>5647227</sourcerecordid><originalsourceid>FETCH-LOGICAL-c138t-aa75fd34f356ca7ea9e4f99b17c4f0afd2648b08a2afbc04cb17b7e14b6cd8c63</originalsourceid><addsrcrecordid>eNo9kEtLAzEUheMLrLU_QNzkD0zN484kWZbio1h0UQVdlTuZGxnppGUSkf57B6yezeGcD87iMHYlxVRK4W5Wi9X7VIkhlhUYpcwRmzhjJSgAo12pj9lIOnCFAGtP2MUfAHX6D8zbOZuk9CkGQSmdsyP2ON92O-zbtI28pvxNFPnso91QzBxjw58wt9uIG76IKfdf3dAnHr6iP9SZUuZpnzJ16ZKdBdwkmhx8zF7vbl_mD8Xy-X4xny0LL7XNBaIpQ6Mh6LLyaAgdQXCulsZDEBgaVYGthUWFofYC_EBqQxLqyjfWV3rMrn93WyJa7_q2w36_PvyifwAxaFSU</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Comparison between Agilent and National Instruments functional test systems</title><source>IEEE Xplore All Conference Series</source><creator>Szabo, Roland ; Gontean, A ; Ioan Lie ; Babaita, Mircea</creator><creatorcontrib>Szabo, Roland ; Gontean, A ; Ioan Lie ; Babaita, Mircea</creatorcontrib><description>This paper presents two test systems, the first with Agilent equipments and the second with National Instruments equipments. A comparison will be made about the characteristics of each. In each test systems will be presented the three main equipments which are compulsory for a functional test system: power supply, multimeter and function generator.</description><identifier>ISSN: 1949-047X</identifier><identifier>ISBN: 1424473942</identifier><identifier>ISBN: 9781424473946</identifier><identifier>EISSN: 1949-0488</identifier><identifier>EISBN: 9781424473953</identifier><identifier>EISBN: 1424473950</identifier><identifier>EISBN: 1424473969</identifier><identifier>EISBN: 9781424473960</identifier><identifier>DOI: 10.1109/SISY.2010.5647227</identifier><language>eng</language><publisher>IEEE</publisher><subject>Driver circuits ; Instruments ; Nickel ; Power supplies ; Programming ; Signal generators ; Voltage measurement</subject><ispartof>IEEE 8th International Symposium on Intelligent Systems and Informatics, 2010, p.87-92</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c138t-aa75fd34f356ca7ea9e4f99b17c4f0afd2648b08a2afbc04cb17b7e14b6cd8c63</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5647227$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5647227$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Szabo, Roland</creatorcontrib><creatorcontrib>Gontean, A</creatorcontrib><creatorcontrib>Ioan Lie</creatorcontrib><creatorcontrib>Babaita, Mircea</creatorcontrib><title>Comparison between Agilent and National Instruments functional test systems</title><title>IEEE 8th International Symposium on Intelligent Systems and Informatics</title><addtitle>SISY</addtitle><description>This paper presents two test systems, the first with Agilent equipments and the second with National Instruments equipments. A comparison will be made about the characteristics of each. In each test systems will be presented the three main equipments which are compulsory for a functional test system: power supply, multimeter and function generator.</description><subject>Driver circuits</subject><subject>Instruments</subject><subject>Nickel</subject><subject>Power supplies</subject><subject>Programming</subject><subject>Signal generators</subject><subject>Voltage measurement</subject><issn>1949-047X</issn><issn>1949-0488</issn><isbn>1424473942</isbn><isbn>9781424473946</isbn><isbn>9781424473953</isbn><isbn>1424473950</isbn><isbn>1424473969</isbn><isbn>9781424473960</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNo9kEtLAzEUheMLrLU_QNzkD0zN484kWZbio1h0UQVdlTuZGxnppGUSkf57B6yezeGcD87iMHYlxVRK4W5Wi9X7VIkhlhUYpcwRmzhjJSgAo12pj9lIOnCFAGtP2MUfAHX6D8zbOZuk9CkGQSmdsyP2ON92O-zbtI28pvxNFPnso91QzBxjw58wt9uIG76IKfdf3dAnHr6iP9SZUuZpnzJ16ZKdBdwkmhx8zF7vbl_mD8Xy-X4xny0LL7XNBaIpQ6Mh6LLyaAgdQXCulsZDEBgaVYGthUWFofYC_EBqQxLqyjfWV3rMrn93WyJa7_q2w36_PvyifwAxaFSU</recordid><startdate>201009</startdate><enddate>201009</enddate><creator>Szabo, Roland</creator><creator>Gontean, A</creator><creator>Ioan Lie</creator><creator>Babaita, Mircea</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201009</creationdate><title>Comparison between Agilent and National Instruments functional test systems</title><author>Szabo, Roland ; Gontean, A ; Ioan Lie ; Babaita, Mircea</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c138t-aa75fd34f356ca7ea9e4f99b17c4f0afd2648b08a2afbc04cb17b7e14b6cd8c63</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Driver circuits</topic><topic>Instruments</topic><topic>Nickel</topic><topic>Power supplies</topic><topic>Programming</topic><topic>Signal generators</topic><topic>Voltage measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Szabo, Roland</creatorcontrib><creatorcontrib>Gontean, A</creatorcontrib><creatorcontrib>Ioan Lie</creatorcontrib><creatorcontrib>Babaita, Mircea</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Szabo, Roland</au><au>Gontean, A</au><au>Ioan Lie</au><au>Babaita, Mircea</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Comparison between Agilent and National Instruments functional test systems</atitle><btitle>IEEE 8th International Symposium on Intelligent Systems and Informatics</btitle><stitle>SISY</stitle><date>2010-09</date><risdate>2010</risdate><spage>87</spage><epage>92</epage><pages>87-92</pages><issn>1949-047X</issn><eissn>1949-0488</eissn><isbn>1424473942</isbn><isbn>9781424473946</isbn><eisbn>9781424473953</eisbn><eisbn>1424473950</eisbn><eisbn>1424473969</eisbn><eisbn>9781424473960</eisbn><abstract>This paper presents two test systems, the first with Agilent equipments and the second with National Instruments equipments. A comparison will be made about the characteristics of each. In each test systems will be presented the three main equipments which are compulsory for a functional test system: power supply, multimeter and function generator.</abstract><pub>IEEE</pub><doi>10.1109/SISY.2010.5647227</doi><tpages>6</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 1949-047X |
ispartof | IEEE 8th International Symposium on Intelligent Systems and Informatics, 2010, p.87-92 |
issn | 1949-047X 1949-0488 |
language | eng |
recordid | cdi_ieee_primary_5647227 |
source | IEEE Xplore All Conference Series |
subjects | Driver circuits Instruments Nickel Power supplies Programming Signal generators Voltage measurement |
title | Comparison between Agilent and National Instruments functional test systems |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T15%3A38%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Comparison%20between%20Agilent%20and%20National%20Instruments%20functional%20test%20systems&rft.btitle=IEEE%208th%20International%20Symposium%20on%20Intelligent%20Systems%20and%20Informatics&rft.au=Szabo,%20Roland&rft.date=2010-09&rft.spage=87&rft.epage=92&rft.pages=87-92&rft.issn=1949-047X&rft.eissn=1949-0488&rft.isbn=1424473942&rft.isbn_list=9781424473946&rft_id=info:doi/10.1109/SISY.2010.5647227&rft.eisbn=9781424473953&rft.eisbn_list=1424473950&rft.eisbn_list=1424473969&rft.eisbn_list=9781424473960&rft_dat=%3Cieee_CHZPO%3E5647227%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c138t-aa75fd34f356ca7ea9e4f99b17c4f0afd2648b08a2afbc04cb17b7e14b6cd8c63%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5647227&rfr_iscdi=true |