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Temperature dependence of capture coefficients in trapping phenomena

The temperature dependence of the capture coefficients in trapping phenomena is investigated. It is proved that, besides the dependence induced by the thermal velocity of the carriers, the stress-induced traps at the interfaces of the multi-layered structures present a supplementary temperature depe...

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Main Authors: Lepadatu, Ana-Maria, Stavarache, Ionel, Lazanu, Sorina, Iancu, Vladimir, Mitroi, Mihai Razvan, Nigmatulin, Raoul Rashid, Ciurea, Magdalena Lidia
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creator Lepadatu, Ana-Maria
Stavarache, Ionel
Lazanu, Sorina
Iancu, Vladimir
Mitroi, Mihai Razvan
Nigmatulin, Raoul Rashid
Ciurea, Magdalena Lidia
description The temperature dependence of the capture coefficients in trapping phenomena is investigated. It is proved that, besides the dependence induced by the thermal velocity of the carriers, the stress-induced traps at the interfaces of the multi-layered structures present a supplementary temperature dependence. This dependence is found to be of Gaussian type and is in a good agreement with the experimental results.
doi_str_mv 10.1109/SMICND.2010.5649094
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subjects capture coefficients
Electron traps
Gaussian distribution
Heating
relaxation currents
Silicon
Strain
Temperature dependence
Traps
title Temperature dependence of capture coefficients in trapping phenomena
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