Detecting the interface state of organic thin-film transistors through hysteresis characteristics

Under white-light irradiation, thin film transistors based on copper phthalocyanine (CuPc) exhibited obvious hysteresis effects when applying bi-directional sweeping gate voltage, the hysteresis window comes up to 32 V. This hysteresis effect is the result of those accumulated photogenerated carrier...

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Bibliographic Details
Main Authors: Zhuoyu Ji, Lijuan Zhen, Liwei Shang, Ming Liu, Hong Wang, Xin Liu, Maixing Han
Format: Conference Proceeding
Language:English
Subjects:
Dielectrics
Electron traps
Hysteresis
Interface states
Logic gates
Semiconductor device measurement
Thin film transistors
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Summary:Under white-light irradiation, thin film transistors based on copper phthalocyanine (CuPc) exhibited obvious hysteresis effects when applying bi-directional sweeping gate voltage, the hysteresis window comes up to 32 V. This hysteresis effect is the result of those accumulated photogenerated carriers trapped in the interface, which proposed a feasible way to detect the state of the interface between organic functional materials and the dielectric layer.
DOI:10.1109/ICSICT.2010.5667641