Accurate Characterization of Broadband Multiconductor Transmission Lines for High-Speed Digital Systems

Accurate modeling of transmission lines becomes increasingly important in high-speed interconnect system design. However, it is rather difficult to obtain broadband transmission line models, in particular using frequency-domain measurements. This paper points out two potential accuracy issues. First...

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Bibliographic Details
Published in:IEEE transactions on advanced packaging 2010-11, Vol.33 (4), p.857-867
Main Authors: KIM, Joong-Ho, OH, Dan, KIM, Woopoung
Format: Article
Language:English
Subjects:
Accuracy
Applied sciences
Broadband communication
DC transmission line parameters
de-embedding technique for multiconductor transmission lines
Design. Technologies. Operation analysis. Testing
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
generalized conversion formula from {\rm S} -parameter to RLGC
Integrated circuits
Interconnected systems
Measurements common to several branches of physics and astronomy
Metrology, measurements and laboratory procedures
Physics
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Studies
Time and frequency
Transmission lines
vector network analyzer (VNA) and time-domain reflectometry (TDR) measurements
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Summary:Accurate modeling of transmission lines becomes increasingly important in high-speed interconnect system design. However, it is rather difficult to obtain broadband transmission line models, in particular using frequency-domain measurements. This paper points out two potential accuracy issues. First, inaccurate DC values of the frequency-domain data cause a severe error in the time-domain simulations. Second, it is difficult to characterize the characteristic impedance over a wide frequency range due to the reflection caused by the port discontinuities. This paper proposes the combination of both time and frequency measurement data to mitigate the DC accuracy issue. For the characteristic impedance model, a new de-embedding technique is presented to mitigate the port discontinuity issue. Several numerical examples, such as MCM-L coplanar lines and package microstrip lines, are studied to validate the accuracy of the proposed method.
ISSN:1521-3323
1557-9980
DOI:10.1109/TADVP.2010.2050204