Diode Power Probe Measurements of Wireless Signals

In this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We show analytically, by simulations, and with meas...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 2011-04, Vol.59 (4), p.987-997
Main Authors: Gomes, H, Testera, Alejandro Rodriguez, Carvalho, Nuno Borges, Fernandez-Barciela, M, Remley, K A
Format: Article
Language:English
Subjects:
Applied sciences
Baseband
Calibration
Circuits
Diode power probe
Diodes
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
Electronics
Exact sciences and technology
Guidelines
Impedance
Integrated circuit modeling
long-term memory effects
Microwaves
Modulation
nonlinear devices
Peak to average power ratio
peak-to-average power ratio (PAPR)
Power measurement
Probes
Schottky diodes
Simulation
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Summary:In this paper, we conduct a thorough analysis of the nonlinear behavior of diode power probes and demonstrate how memory effects can alter power measurements of signals with wide modulation bandwidths and high values of peak-to-average power ratio. We show analytically, by simulations, and with measurements, that commonly used single-tone calibration procedures for diode power probes can provide erroneous values when measuring modulated signals used in many new wireless standards. We show that high values of peak-to-average-power ratio can degrade the calibration results due to the low-frequency response imposed by the power probe's baseband circuit impedance. This effect is first theoretically demonstrated by use of a Volterra series, and then validated by simulations and measurements with a diode power probe circuit. This study provides engineers with guidelines for techniques for correction of diode power probe measurements.
ISSN:0018-9480
1557-9670
DOI:10.1109/TMTT.2010.2100405