A MEMS based device interface board

At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and t...

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Bibliographic Details
Main Authors: Kandalaft, N, Basith, I, Rashidzadeh, R
Format: Conference Proceeding
Language:English
Subjects:
Capacitance
Micromechanical devices
Resistance
Simulation
Sockets
Springs
Transmission line measurements
Online Access:Request full text
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Description
Summary:At gigahertz frequency range, performance degradation of the device interface board increases the yield loss and the cost of manufacturing. In this poster a MEMS based solution is proposed to design a Device Interface Board (DIB) supporting high-speed connectivity between the device under test and the tester. Simulation results indicate that the proposed scheme can operate up to 50 GHz without considerable signal integrity degradation.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2010.5699296