Detecting and diagnosing open defects

One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault...

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Bibliographic Details
Main Authors: Tran, D, Winemberg, L, Carder, D, Xijiang Lin, LeBritton, J, Swanson, B
Format: Conference Proceeding
Language:English
Online Access:Request full text
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Summary:One of the common failures found in manufactured ICs are interconnect opens. While stuck-at and transition fault automatic test pattern generation (ATPG) patterns can detect open defects, these fault models do not catch all of them. This poster describes a project and research with a new open fault model to supplement the others. The project consists of many parts that target specific types of known open defects.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2010.5699303