NIST comparison of the quantized Hall resistance and the realization of the SI OHM through the calculable capacitor

The latest NIST result from the comparison of the quantized Hall resistance (QHR) with the realization of the SI ohm obtained from the NIST calculable capacitor is reported. A small difference between the 1988 result and the present result has led to a re-evaluation of the sources and magnitudes of...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1997-04, Vol.46 (2), p.264-268
Main Authors: Jeffery, A.-M., Elmquist, R.E., Lee, L.H., Shields, J.Q., Dziuba, R.F.
Format: Article
Language:English
Subjects:
Bridge circuits
Capacitors
Electrical and electronic components, instruments and techniques
Electrical resistance measurement
Electrodes
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Measurement standards
Metrology
Metrology, measurements and laboratory procedures
Minerals
NIST
Optical interferometry
Physics
Resistors
Units and standards
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Summary:The latest NIST result from the comparison of the quantized Hall resistance (QHR) with the realization of the SI ohm obtained from the NIST calculable capacitor is reported. A small difference between the 1988 result and the present result has led to a re-evaluation of the sources and magnitudes of possible systematic errors.
ISSN:0018-9456
1557-9662
DOI:10.1109/19.571828