Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods

Breakdowns are the usual limitation of the dielectric using. Nowadays, the irradiation of materials by the electron beam of a scanning electron microscope can exhibit such breakdown events and also permit more elementary characterization of charging properties of non conducting materials. So, SEM ha...

Full description

Saved in:
Bibliographic Details
Main Authors: Ghorbel, N, Kallel, A
Format: Conference Proceeding
Language:English
Subjects:
Electron beams
Electron traps
Insulators
Materials
Mirrors
Radiation effects
Scanning electron microscopy
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 4
container_issue
container_start_page 1
container_title
container_volume
creator Ghorbel, N
Kallel, A
description Breakdowns are the usual limitation of the dielectric using. Nowadays, the irradiation of materials by the electron beam of a scanning electron microscope can exhibit such breakdown events and also permit more elementary characterization of charging properties of non conducting materials. So, SEM has been equipped to study the fundamental aspects of charge trapping in insulating materials, by two complementary techniques: the induced current method (ICM) and the mirror method (SEMME). Here we are more concerned by study certain phenomena responsible for obtaining elliptical or circular images dependent on the crystallographic direction in MgO material. We develop then the experimental results of induced current. They are used to validate this method which proves of a great interest and very relevant for any study aiming at approaching the state of dielectric material.
doi_str_mv 10.1109/CEIDP.2010.5724088
format conference_proceeding
fullrecord <record><control><sourceid>ieee_CHZPO</sourceid><recordid>TN_cdi_ieee_primary_5724088</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>5724088</ieee_id><sourcerecordid>5724088</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-b2d5e8192fff8341f07ecb24a4c12dec9679d28078e9e78afb091b14331c75ba3</originalsourceid><addsrcrecordid>eNpNkM1OwzAQhM1PJaKSF4CLXyDF3jixzQ2FApGKygHOxbHXrVGTICc98PakogfmstrZ_eYwhNxwtuCc6btqWT--LYBNeyFBMKXOSKql4gKE0EJyOCcJFLLMINfy4v-tVHBJEsaUyDQvYUYSqbNSaMXKK5IOwxebVIBUTCTks9qZuEXaohkOEVvsRho6inu0Y-w7GmI0LpgRHbUYTRssfd2u72nduYM9mocYj4zpHG2n5z5S9H6Cp8Rx17vhmsy82Q-YnuacfDwt36uXbLV-rquHVRa4LMasAVeg4hq89yoX3DOJtgFhhOXg0OpSageKSYUapTK-YZo3XOQ5t7JoTD4nt3-5ARE33zG0Jv5sTt3lv_4UXO0</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods</title><source>IEEE Xplore All Conference Series</source><creator>Ghorbel, N ; Kallel, A</creator><creatorcontrib>Ghorbel, N ; Kallel, A</creatorcontrib><description>Breakdowns are the usual limitation of the dielectric using. Nowadays, the irradiation of materials by the electron beam of a scanning electron microscope can exhibit such breakdown events and also permit more elementary characterization of charging properties of non conducting materials. So, SEM has been equipped to study the fundamental aspects of charge trapping in insulating materials, by two complementary techniques: the induced current method (ICM) and the mirror method (SEMME). Here we are more concerned by study certain phenomena responsible for obtaining elliptical or circular images dependent on the crystallographic direction in MgO material. We develop then the experimental results of induced current. They are used to validate this method which proves of a great interest and very relevant for any study aiming at approaching the state of dielectric material.</description><identifier>ISSN: 0084-9162</identifier><identifier>ISBN: 9781424494682</identifier><identifier>ISBN: 1424494680</identifier><identifier>EISSN: 2576-2397</identifier><identifier>EISBN: 9781424494712</identifier><identifier>EISBN: 1424494702</identifier><identifier>EISBN: 9781424494705</identifier><identifier>EISBN: 1424494710</identifier><identifier>DOI: 10.1109/CEIDP.2010.5724088</identifier><identifier>LCCN: 79-649806</identifier><language>eng</language><publisher>IEEE</publisher><subject>Electron beams ; Electron traps ; Insulators ; Materials ; Mirrors ; Radiation effects ; Scanning electron microscopy</subject><ispartof>2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena, 2010, p.1-4</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5724088$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5724088$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ghorbel, N</creatorcontrib><creatorcontrib>Kallel, A</creatorcontrib><title>Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods</title><title>2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena</title><addtitle>CEIDP</addtitle><description>Breakdowns are the usual limitation of the dielectric using. Nowadays, the irradiation of materials by the electron beam of a scanning electron microscope can exhibit such breakdown events and also permit more elementary characterization of charging properties of non conducting materials. So, SEM has been equipped to study the fundamental aspects of charge trapping in insulating materials, by two complementary techniques: the induced current method (ICM) and the mirror method (SEMME). Here we are more concerned by study certain phenomena responsible for obtaining elliptical or circular images dependent on the crystallographic direction in MgO material. We develop then the experimental results of induced current. They are used to validate this method which proves of a great interest and very relevant for any study aiming at approaching the state of dielectric material.</description><subject>Electron beams</subject><subject>Electron traps</subject><subject>Insulators</subject><subject>Materials</subject><subject>Mirrors</subject><subject>Radiation effects</subject><subject>Scanning electron microscopy</subject><issn>0084-9162</issn><issn>2576-2397</issn><isbn>9781424494682</isbn><isbn>1424494680</isbn><isbn>9781424494712</isbn><isbn>1424494702</isbn><isbn>9781424494705</isbn><isbn>1424494710</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2010</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpNkM1OwzAQhM1PJaKSF4CLXyDF3jixzQ2FApGKygHOxbHXrVGTICc98PakogfmstrZ_eYwhNxwtuCc6btqWT--LYBNeyFBMKXOSKql4gKE0EJyOCcJFLLMINfy4v-tVHBJEsaUyDQvYUYSqbNSaMXKK5IOwxebVIBUTCTks9qZuEXaohkOEVvsRho6inu0Y-w7GmI0LpgRHbUYTRssfd2u72nduYM9mocYj4zpHG2n5z5S9H6Cp8Rx17vhmsy82Q-YnuacfDwt36uXbLV-rquHVRa4LMasAVeg4hq89yoX3DOJtgFhhOXg0OpSageKSYUapTK-YZo3XOQ5t7JoTD4nt3-5ARE33zG0Jv5sTt3lv_4UXO0</recordid><startdate>201010</startdate><enddate>201010</enddate><creator>Ghorbel, N</creator><creator>Kallel, A</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>201010</creationdate><title>Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods</title><author>Ghorbel, N ; Kallel, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-b2d5e8192fff8341f07ecb24a4c12dec9679d28078e9e78afb091b14331c75ba3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Electron beams</topic><topic>Electron traps</topic><topic>Insulators</topic><topic>Materials</topic><topic>Mirrors</topic><topic>Radiation effects</topic><topic>Scanning electron microscopy</topic><toplevel>online_resources</toplevel><creatorcontrib>Ghorbel, N</creatorcontrib><creatorcontrib>Kallel, A</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ghorbel, N</au><au>Kallel, A</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods</atitle><btitle>2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena</btitle><stitle>CEIDP</stitle><date>2010-10</date><risdate>2010</risdate><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0084-9162</issn><eissn>2576-2397</eissn><isbn>9781424494682</isbn><isbn>1424494680</isbn><eisbn>9781424494712</eisbn><eisbn>1424494702</eisbn><eisbn>9781424494705</eisbn><eisbn>1424494710</eisbn><abstract>Breakdowns are the usual limitation of the dielectric using. Nowadays, the irradiation of materials by the electron beam of a scanning electron microscope can exhibit such breakdown events and also permit more elementary characterization of charging properties of non conducting materials. So, SEM has been equipped to study the fundamental aspects of charge trapping in insulating materials, by two complementary techniques: the induced current method (ICM) and the mirror method (SEMME). Here we are more concerned by study certain phenomena responsible for obtaining elliptical or circular images dependent on the crystallographic direction in MgO material. We develop then the experimental results of induced current. They are used to validate this method which proves of a great interest and very relevant for any study aiming at approaching the state of dielectric material.</abstract><pub>IEEE</pub><doi>10.1109/CEIDP.2010.5724088</doi><tpages>4</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0084-9162
ispartof 2010 Annual Report Conference on Electrical Insulation and Dielectic Phenomena, 2010, p.1-4
issn 0084-9162
2576-2397
language eng
recordid cdi_ieee_primary_5724088
source IEEE Xplore All Conference Series
subjects Electron beams
Electron traps
Insulators
Materials
Mirrors
Radiation effects
Scanning electron microscopy
title Charge measurement in electron irradiated ceramic MgO: Induced current and mirror effect methods
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T20%3A36%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_CHZPO&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Charge%20measurement%20in%20electron%20irradiated%20ceramic%20MgO:%20Induced%20current%20and%20mirror%20effect%20methods&rft.btitle=2010%20Annual%20Report%20Conference%20on%20Electrical%20Insulation%20and%20Dielectic%20Phenomena&rft.au=Ghorbel,%20N&rft.date=2010-10&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=0084-9162&rft.eissn=2576-2397&rft.isbn=9781424494682&rft.isbn_list=1424494680&rft_id=info:doi/10.1109/CEIDP.2010.5724088&rft.eisbn=9781424494712&rft.eisbn_list=1424494702&rft.eisbn_list=9781424494705&rft.eisbn_list=1424494710&rft_dat=%3Cieee_CHZPO%3E5724088%3C/ieee_CHZPO%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-b2d5e8192fff8341f07ecb24a4c12dec9679d28078e9e78afb091b14331c75ba3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=5724088&rfr_iscdi=true