On-wafer mm-wave V-band semi-automatic power measurement system

This paper proposes an on-wafer mm-wave V-band semi-automatic power measurement system (OMVSPMS) with some external passive attenuators (ATT) for mm-wave circuits and presents the calibration and measurement method programmed by standard commands for programmable instruments (SCPI) language with Agi...

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Bibliographic Details
Main Authors: Hsu-Feng Hsiao, Shuw-Guann Lin, Hwann-Kaeo Chiou, Da-Chiang Chang, Ying-Zong Juang
Format: Conference Proceeding
Language:English
Subjects:
automatic
Calibration
Frequency measurement
Gain
measurement
On-wafer
power
Power generation
Power measurement
Probes
Software
V-band
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Summary:This paper proposes an on-wafer mm-wave V-band semi-automatic power measurement system (OMVSPMS) with some external passive attenuators (ATT) for mm-wave circuits and presents the calibration and measurement method programmed by standard commands for programmable instruments (SCPI) language with Agilent VEE software. Since accurate measurement results are desirable, for example, the 1-dB compression point (P 1dB ) and the input third order intercept point (IP3) are items of linearity for mm-wave active circuits. Both also need right power into device under test (DUT) to expect right P 1dB and IP3. Therefore, an implementation of calibration and measurement method combined traditional mm-wave instruments with some external passive attenuators is used for accurate power generation of the stimulus and accurate power reception of the receiver.
ISSN:2165-4727
2165-4743