TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation

We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2011-08, Vol.58 (4), p.1927-1934
Main Authors: Kastensmidt, F. L., Fonseca, E. C. P., Vaz, R. G., Goncalez, O. L., Chipana, R., Wirth, G. I.
Format: Article
Language:English
Subjects:
Circuits
Degradation
Failure
Field programmable gate arrays
Flash-based FPGA
Inverters
Logic
Logic circuits
Logic gates
Mapping
propagation-delay degradation
Radiation effects
Simulation
Temperature measurement
total ionizing dose (TID)
Transistors
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Summary:We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried out to study the difference of behavior in the degradation of different logic mappings.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2011.2128881