Single Photon Detectors for Ultra Low Voltage Time-Resolved Emission Measurements

Using time-resolved emission to measure electrical signals inside very-large-scale integration complementary metal-oxide-semiconductor circuits in a non-invasive fashion is a very powerful technique. However, node scaling and the related supply voltage reduction have created significant challenges....

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Bibliographic Details
Published in:IEEE journal of quantum electronics 2011-06, Vol.47 (6), p.841-848
Main Authors: Stellari, F, Peilin Song, Weger, A J
Format: Article
Language:English
Subjects:
Detectors
Emission
Indium gallium arsenide
Indium gallium arsenides
Insulators
Low voltage
Photon avalanches
Photonics
Photons
Picosecond imaging for circuit analysis
Signal to noise ratio
single photon avalanche photodiode
superconducting single-photon detector
Superconductivity
time-resolved emission
Vehicles
Voltage measurement
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Summary:Using time-resolved emission to measure electrical signals inside very-large-scale integration complementary metal-oxide-semiconductor circuits in a non-invasive fashion is a very powerful technique. However, node scaling and the related supply voltage reduction have created significant challenges. In this paper, we investigate the limits of established and prototype single photon detectors for future low voltage applications. In particular the performance of a state of the art InGaAs single photon avalanche photodiode and a superconducting single photon detector are reported and compared for low voltage applications using test vehicles fabricated in IBM 65 nm silicon on insulator technologies.
ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2011.2129493