A technique to calculate the MBU distribution of a memory under radiation suffering the event accumulation problem

When radiating memories, SEUs/MBUs tend to accumulate, making difficult to characterize the number of events and error patterns that have affected the system. A technique to deal with this problem is presented in this paper.

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Bibliographic Details
Main Authors: Reviriego, P, Maestro, J A
Format: Conference Proceeding
Language:English
Subjects:
memories
Multiple Bit Upsets (MBUs)
reliability
Online Access:Request full text
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Description
Summary:When radiating memories, SEUs/MBUs tend to accumulate, making difficult to characterize the number of events and error patterns that have affected the system. A technique to deal with this problem is presented in this paper.
ISSN:0379-6566
DOI:10.1109/RADECS.2008.5782750