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InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates
Vertical-cavity surface-emitting lasers have been integrated onto silicon substrates using a new substrate removal process and low temperature PdGe contacts. A reduction in threshold current of 30% was observed for devices integrated onto silicon.
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container_end_page | 283 vol.1 |
container_issue | |
container_start_page | 282 |
container_title | |
container_volume | 1 |
creator | Mathine, D.L. Fathollahnejad, H. Droopad, R. Daryanani, S. Maracas, G.N. |
description | Vertical-cavity surface-emitting lasers have been integrated onto silicon substrates using a new substrate removal process and low temperature PdGe contacts. A reduction in threshold current of 30% was observed for devices integrated onto silicon. |
doi_str_mv | 10.1109/LEOS.1994.587003 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_587003</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>587003</ieee_id><sourcerecordid>587003</sourcerecordid><originalsourceid>FETCH-ieee_primary_5870033</originalsourceid><addsrcrecordid>eNp9js1qg0AURgdCID91X7qaF9DMoKIuS7FtIJBFspdbuQk3jGMy92rJ20do1_k2h8PZfEq9WpNYa6rNrt4fEltVWZKXhTHpTK1MUZrUZpMtVMR8MdOy3FS2WKpm67_gnfVtAC9Dp3_ROT1iEGrBxS2MJHfNQzhBizF2JEL-rB0wBtbkBc8BhHqvey-9ZnLUTsLDD8sUkF_U_ASOMfrnWr191seP75gQsbkG6iDcm7-r6dP4AO4ARPk</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Mathine, D.L. ; Fathollahnejad, H. ; Droopad, R. ; Daryanani, S. ; Maracas, G.N.</creator><creatorcontrib>Mathine, D.L. ; Fathollahnejad, H. ; Droopad, R. ; Daryanani, S. ; Maracas, G.N.</creatorcontrib><description>Vertical-cavity surface-emitting lasers have been integrated onto silicon substrates using a new substrate removal process and low temperature PdGe contacts. A reduction in threshold current of 30% was observed for devices integrated onto silicon.</description><identifier>ISBN: 0780314700</identifier><identifier>ISBN: 9780780314702</identifier><identifier>DOI: 10.1109/LEOS.1994.587003</identifier><language>eng</language><publisher>IEEE</publisher><subject>Gallium arsenide ; Indium gallium arsenide ; Optical arrays ; Optical surface waves ; Quantum well lasers ; Silicon ; Surface emitting lasers ; Thermal conductivity ; Threshold current ; Vertical cavity surface emitting lasers</subject><ispartof>Proceedings of LEOS'94, 1994, Vol.1, p.282-283 vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/587003$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/587003$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Mathine, D.L.</creatorcontrib><creatorcontrib>Fathollahnejad, H.</creatorcontrib><creatorcontrib>Droopad, R.</creatorcontrib><creatorcontrib>Daryanani, S.</creatorcontrib><creatorcontrib>Maracas, G.N.</creatorcontrib><title>InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates</title><title>Proceedings of LEOS'94</title><addtitle>LEOS</addtitle><description>Vertical-cavity surface-emitting lasers have been integrated onto silicon substrates using a new substrate removal process and low temperature PdGe contacts. A reduction in threshold current of 30% was observed for devices integrated onto silicon.</description><subject>Gallium arsenide</subject><subject>Indium gallium arsenide</subject><subject>Optical arrays</subject><subject>Optical surface waves</subject><subject>Quantum well lasers</subject><subject>Silicon</subject><subject>Surface emitting lasers</subject><subject>Thermal conductivity</subject><subject>Threshold current</subject><subject>Vertical cavity surface emitting lasers</subject><isbn>0780314700</isbn><isbn>9780780314702</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1994</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9js1qg0AURgdCID91X7qaF9DMoKIuS7FtIJBFspdbuQk3jGMy92rJ20do1_k2h8PZfEq9WpNYa6rNrt4fEltVWZKXhTHpTK1MUZrUZpMtVMR8MdOy3FS2WKpm67_gnfVtAC9Dp3_ROT1iEGrBxS2MJHfNQzhBizF2JEL-rB0wBtbkBc8BhHqvey-9ZnLUTsLDD8sUkF_U_ASOMfrnWr191seP75gQsbkG6iDcm7-r6dP4AO4ARPk</recordid><startdate>1994</startdate><enddate>1994</enddate><creator>Mathine, D.L.</creator><creator>Fathollahnejad, H.</creator><creator>Droopad, R.</creator><creator>Daryanani, S.</creator><creator>Maracas, G.N.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1994</creationdate><title>InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates</title><author>Mathine, D.L. ; Fathollahnejad, H. ; Droopad, R. ; Daryanani, S. ; Maracas, G.N.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_5870033</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Gallium arsenide</topic><topic>Indium gallium arsenide</topic><topic>Optical arrays</topic><topic>Optical surface waves</topic><topic>Quantum well lasers</topic><topic>Silicon</topic><topic>Surface emitting lasers</topic><topic>Thermal conductivity</topic><topic>Threshold current</topic><topic>Vertical cavity surface emitting lasers</topic><toplevel>online_resources</toplevel><creatorcontrib>Mathine, D.L.</creatorcontrib><creatorcontrib>Fathollahnejad, H.</creatorcontrib><creatorcontrib>Droopad, R.</creatorcontrib><creatorcontrib>Daryanani, S.</creatorcontrib><creatorcontrib>Maracas, G.N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Mathine, D.L.</au><au>Fathollahnejad, H.</au><au>Droopad, R.</au><au>Daryanani, S.</au><au>Maracas, G.N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates</atitle><btitle>Proceedings of LEOS'94</btitle><stitle>LEOS</stitle><date>1994</date><risdate>1994</risdate><volume>1</volume><spage>282</spage><epage>283 vol.1</epage><pages>282-283 vol.1</pages><isbn>0780314700</isbn><isbn>9780780314702</isbn><abstract>Vertical-cavity surface-emitting lasers have been integrated onto silicon substrates using a new substrate removal process and low temperature PdGe contacts. A reduction in threshold current of 30% was observed for devices integrated onto silicon.</abstract><pub>IEEE</pub><doi>10.1109/LEOS.1994.587003</doi></addata></record> |
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identifier | ISBN: 0780314700 |
ispartof | Proceedings of LEOS'94, 1994, Vol.1, p.282-283 vol.1 |
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language | eng |
recordid | cdi_ieee_primary_587003 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Gallium arsenide Indium gallium arsenide Optical arrays Optical surface waves Quantum well lasers Silicon Surface emitting lasers Thermal conductivity Threshold current Vertical cavity surface emitting lasers |
title | InGaAs quantum well vertical-cavity surface-emitting lasers integration onto silicon substrates |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T21%3A35%3A09IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=InGaAs%20quantum%20well%20vertical-cavity%20surface-emitting%20lasers%20integration%20onto%20silicon%20substrates&rft.btitle=Proceedings%20of%20LEOS'94&rft.au=Mathine,%20D.L.&rft.date=1994&rft.volume=1&rft.spage=282&rft.epage=283%20vol.1&rft.pages=282-283%20vol.1&rft.isbn=0780314700&rft.isbn_list=9780780314702&rft_id=info:doi/10.1109/LEOS.1994.587003&rft_dat=%3Cieee_6IE%3E587003%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_5870033%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=587003&rfr_iscdi=true |