The effects of proton irradiation on coolrunner-II - CPID technology

Nowadays, Complex Programmable Devices are highly demanded in space missions. In this sense, CoolRunner-II devices are very attractive due to their low-power consumption. However, there is no report on proton sensitivity for this technology until date. In this work proton irradiation tests were perf...

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Bibliographic Details
Main Authors: Garcia-Valderas, M., Portela-Garcia, M., Lopez-Ongil, C., Entrena, L., Martin-Ortega, A., de Mingo, J. R., Alvarez, M., Esteve, S., Rodriguez, S.
Format: Conference Proceeding
Language:English
Subjects:
CPLD technology
Field programmable gate arrays
Flash memory
Performance evaluation
proton irradiation effects
Protons
Radiation effects
Random access memory
Sensitivity
single event effect
single event upset
test facilities
TID
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Summary:Nowadays, Complex Programmable Devices are highly demanded in space missions. In this sense, CoolRunner-II devices are very attractive due to their low-power consumption. However, there is no report on proton sensitivity for this technology until date. In this work proton irradiation tests were performed on these devices in the energy range from 6 to 63 MeV in both static and dynamic modes. The results reported allow considering these devices suitable for space applications.
ISSN:0379-6566
DOI:10.1109/RADECS.2008.5944064