A simple linear technique for measuring the carrier-envelope offset phase of ultrashort pulses

A spectrally resolved multiple beam interferometer is capable for measuring the carrier envelope offset phase of ultrashort laser pulses with an accuracy of 70 mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.

Saved in:
Bibliographic Details
Main Authors: Jojart, P., Borzsonyi, A., Koke, S., Gorbe, M., Osvay, K.
Format: Conference Proceeding
Language:English
Subjects:
Laser beams
Measurement by laser beam
Optical beams
Optical interferometry
Oscillators
Phase measurement
Ultrafast optics
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A spectrally resolved multiple beam interferometer is capable for measuring the carrier envelope offset phase of ultrashort laser pulses with an accuracy of 70 mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.
ISSN:2160-8989
2160-9004
DOI:10.1364/CLEO_SI.2011.CWI6