Optical Metrology For MR Heads

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Bibliographic Details
Main Authors: Al-Jumaily, G., Kief, M.T., Mowry, G.S.
Format: Conference Proceeding
Language:English
Subjects:
Light scattering
Metrology
Optical films
Optical refraction
Optical scattering
Optical surface waves
Pollution measurement
Rough surfaces
Surface roughness
Thickness measurement
Online Access:Request full text
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DOI:10.1109/INTMAG.1997.597835