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Narrow-Width Effects on a Body-Tied Partially Depleted SOI MOSFET

In this paper, we present the investigation of narrow-width effects (NWEs) on partially depleted (PD) silicon-on-insulator (SOI) with different gate shape topologies. Based on dc/ac measurements and TCAD simulations, it shows detailed clarifications of body-tied-induced NWEs. The overall study demon...

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Published in:IEEE transactions on electron devices 2011-11, Vol.58 (11), p.3793-3800
Main Authors: Valentin, R., Bertrand, G., Puget, S., Scheer, P., Juge, A., Jaouen, H., Raynaud, C.
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container_issue 11
container_start_page 3793
container_title IEEE transactions on electron devices
container_volume 58
creator Valentin, R.
Bertrand, G.
Puget, S.
Scheer, P.
Juge, A.
Jaouen, H.
Raynaud, C.
description In this paper, we present the investigation of narrow-width effects (NWEs) on partially depleted (PD) silicon-on-insulator (SOI) with different gate shape topologies. Based on dc/ac measurements and TCAD simulations, it shows detailed clarifications of body-tied-induced NWEs. The overall study demonstrates relationship between gate shape topologies, body-tied shape, and electrical width of the transistor. Provided physical-based analytical models are able to capture peak GM and C GG as function of gate length, transistor width, physical gate-overlap width, and number of body tied. This results in improving the overall model accuracy of body contact and floating-body PD SOI MOSFETs.
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source IEEE Electronic Library (IEL) Journals
subjects 65 nm
Applied sciences
Body contact
body tied
Contact
Contacts
Depletion
Electronics
Exact sciences and technology
Gates
Logic gates
Mathematical analysis
MOSFET
MOSFET circuits
MOSFETs
narrow-width effects (NWEs)
partially depleted (PD)
Semiconductor devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Shape
Silicon on insulator technology
silicon-on-insulator (SOI)
Topology
Transistors
title Narrow-Width Effects on a Body-Tied Partially Depleted SOI MOSFET
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