Workshop and panel discussions

Due to downscaling of technology and increase of package size, a reduction in economically achievable CDM robustness of ICs is predicted. The workshop addresses the options and the status of CDM control in manufacturing and testing environments. The necessity of developing more advanced CDM control...

Full description

Saved in:
Bibliographic Details
Main Authors: Gossner, Harald, Gaertner, Reinhold, Carn, Brett, Blanc, Fabrice, Gauthier, Robert, Boselli, Gianluca, Duvvury, Charvaka
Format: Conference Proceeding
Language:English
Subjects:
Conferences
Electrostatic discharge
Foundries
Integrated circuits
IP networks
Manufacturing
Stress
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Due to downscaling of technology and increase of package size, a reduction in economically achievable CDM robustness of ICs is predicted. The workshop addresses the options and the status of CDM control in manufacturing and testing environments. The necessity of developing more advanced CDM control methods will be discussed. Another question is about the best way for world-wide implementation of advanced CDM control measures and the related costs.