Heavy Ion Single Event Effects Performance of RadHard Devices Migrated to an Alternate Wafer Fab

Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.

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Bibliographic Details
Main Authors: Hafer, C., Lahey, M., Harris, D., Larsen, J., Sievert, F., Sims, T., Meyer, S., Dumitru, R., Jordan, A., Milliken, P.
Format: Conference Proceeding
Language:English
Subjects:
Application specific integrated circuits
Arrays
Logic gates
Performance evaluation
Power supplies
Springs
Tin
Online Access:Request full text
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Description
Summary:Aeroflex mitigates the concern of IC part obsolescence by migrating RadHard devices to alternate wafer fabs as fabs become shuttered or unavailable. Comparison radiation performance data are presented for recently migrated devices.
ISSN:2154-0519
DOI:10.1109/REDW.2010.6062506