Toward the matrix polarimetry method of thin film coatings

The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculi...

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Bibliographic Details
Main Authors: Pidkamin, L. J., Arkhelyuk, A. D., Brus, V. V.
Format: Conference Proceeding
Language:English
Subjects:
Coatings
Optical films
Optical imaging
Optical polarization
Optical scattering
Shape
Silicon
Online Access:Request full text
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Summary:The results obtained from studying the impact of optical-geometrical parameters of thin-layered models containing the particles of different shapes and sizes as well as the degree of orient ability toward their light scattering matrices how been analyzed. A special emphasis is placed upon the peculiar aspects of the matrix polarimetry method and it is in fact expedient to use this technique in implementing and developing the non-destructive methods to control thin film coatings.