Electronic equipment dielectric and thermal withstand capability curves for refunding analysis purposes

• Main Authors: Gondim, I. N., Tavares, C. E., Barbosa, J. A. F., Oliveira, J. C., Delaiba, A. C., Mendonca, M. V. B.
• Format: Conference Proceeding
• Language: English
• Subjects: computational analysis of refunding request for damages; current limits; Supportability of equipment; voltage limits
• ISSN: 2150-6647; 2150-6655
• DOI: 10.1109/EPQU.2011.6128812

This paper is aimed at obtaining dielectric and thermal withstand capability curves of electronic devices in order to demonstrate the allowable voltage and current effect limits. The idea is to establish a computational procedure to compare system voltage and current disturbances with the equipment tolerance permitted values to guarantee the physical integrality of the product. To highlight the methodology, new and second hand TV, stereo, personal computer units are experimentally driven to their extreme dielectric and thermal strengths. The results are then referred as tolerance curves which are used as guidelines for the computational analysis of the consistency of a given relationship between a system occurrence and the consumer claimed damage for a specific product. The applicability of the whole process can be justified by the growing interest in the establishment of systematic procedures, based on well accepted computational simulations, yielding final reports that provide the necessary answer to the refunding process demand.