Self-heating induced feedback effect on drain current mismatch and its modeling

We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the va...

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Bibliographic Details
Main Authors: Kuo, J. J.-Y, Pin Su
Format: Conference Proceeding
Language:English
Subjects:
Data models
FinFETs
Integrated circuit modeling
Logic gates
Temperature
Temperature dependence
Online Access:Request full text
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Description
Summary:We have reported and modeled a self-heating induced feedback effect on the drain current mismatch of nanoscale MOSFETs. The accuracy of the new model has been verified with experimental data. This effect needs to be considered when one-to-one comparisons between SOI and bulk devices regarding the variability are made.
ISSN:0163-1918
2156-017X
DOI:10.1109/IEDM.2011.6131496