A very large area (100 mm2) silicon drift detector for EXAFS applications

• Main Authors: Barkan, S., Saveliev, V. D., Liangyuan Feng, Takahashi, M., Damron, E. V., Tull, C., Sterbinsky, G. E., Woicik, J. C.
• Format: Conference Proceeding
• Language: English
• Subjects: Atomic measurements; Detectors; Manganese
• ISSN: 1082-3654; 2577-0829
• DOI: 10.1109/NSSMIC.2011.6154113

A 100 mm 2 silicon drift detector (SDD) has been developed in an effort to improve the solid angle of our Vortex ® SDD. The 100 mm 2 SDD features the same basic structure as our smaller area (50 mm 2 ) devices and possesses the same advantages, including low noise, high count rates, and excellent energy resolution with thermoelectric cooling. The 100 mm 2 SDD is ideal for low or high count rate applications in which the x-rays of interest are occurring over a large solid angle, such as are encountered in TXRF (total reflection x-ray ray fluorescence), EXAFS (extended x-ray absorption fine structure) and other synchrotron applications. The new 100 mm 2 SDD has been evaluated in an EXAFS experiment at the National Synchrotron Light Source at Brookhaven National Laboratory, which investigated the local atomic structure surrounding Mn in a LaMnO 3 /SrMnO 3 superlattice. Results show that the new large area SDD delivers excellent energy resolution, high peak-to-background and significantly reduces the data collection time for these types of sensitive EXAFS measurements.