Towards spectral-domain optical coherence tomography on a silicon chip

We present experimental results of a spectral-domain optical coherence tomography system that includes an integrated spectrometer. A depth range of 1 mm and axial resolution of 19 μm was measured. A layered phantom was imaged.

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Bibliographic Details
Main Authors: Akca, B. I., Nguyen, V. D., Kalkman, J., van Leeuwen, T. G., Worhoff, K., de Ridder, R. M., Pollnau, M.
Format: Conference Proceeding
Language:English
Subjects:
Arrayed waveguide gratings
Optical fibers
Optical imaging
Optical interferometry
Tomography
Online Access:Request full text
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Description
Summary:We present experimental results of a spectral-domain optical coherence tomography system that includes an integrated spectrometer. A depth range of 1 mm and axial resolution of 19 μm was measured. A layered phantom was imaged.
DOI:10.1109/IQEC-CLEO.2011.6193665