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Methodology for predictive calibration of TCAD simulators
This paper presents an original methodology for calibrating Technology Computer-Aided Design (TCAD) simulators. This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi's methodolog...
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creator | Le Carval, G. Scheiblin, P. Poncet, D. Rivallin, P. |
description | This paper presents an original methodology for calibrating Technology Computer-Aided Design (TCAD) simulators. This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi's methodology, allows to minimise the difference between simulations and measurements while being the less sensitive to the fluctuations of the manufacturing process. The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works. |
doi_str_mv | 10.1109/SISPAD.1997.621366 |
format | conference_proceeding |
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This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi's methodology, allows to minimise the difference between simulations and measurements while being the less sensitive to the fluctuations of the manufacturing process. The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works.</description><identifier>ISBN: 9780780337756</identifier><identifier>ISBN: 0780337751</identifier><identifier>DOI: 10.1109/SISPAD.1997.621366</identifier><language>eng</language><publisher>IEEE</publisher><subject>Analytical models ; Calibration ; Computational modeling ; Computer simulation ; Design optimization ; Filtering ; Fluctuations ; Predictive models ; Statistical analysis ; US Department of Energy</subject><ispartof>SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. 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The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works.</description><subject>Analytical models</subject><subject>Calibration</subject><subject>Computational modeling</subject><subject>Computer simulation</subject><subject>Design optimization</subject><subject>Filtering</subject><subject>Fluctuations</subject><subject>Predictive models</subject><subject>Statistical analysis</subject><subject>US Department of Energy</subject><isbn>9780780337756</isbn><isbn>0780337751</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1997</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj11LwzAYRgMiKLN_YFf5A61J3jRtLkvnx2CisHk93uZDI50ZSRT27x3MhwPn7sBDyJKzhnOm77fr7duwarjWXaMEB6WuSKW7np0B6LpW3ZAq5y92npQtCHZL9Isrn9HGOX6cqI-JHpOzwZTw66jBOUwJS4jfNHq6G4cVzeHwM2OJKd-Ra49zdtW_F-T98WE3Pteb16f1OGzqwJkstRDCS1TGCdGjg8kYY32LGiyqXqJRAhAZThq86jmilJ5zDWihbTkzAAuyvHSDc25_TOGA6bS__IM_rDRGiw</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>Le Carval, G.</creator><creator>Scheiblin, P.</creator><creator>Poncet, D.</creator><creator>Rivallin, P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1997</creationdate><title>Methodology for predictive calibration of TCAD simulators</title><author>Le Carval, G. ; Scheiblin, P. ; Poncet, D. ; Rivallin, P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i104t-222f4a6ce228ae3bcccdf5a93da684ac623aa0ab93f681aa44f1193ad35510c33</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Analytical models</topic><topic>Calibration</topic><topic>Computational modeling</topic><topic>Computer simulation</topic><topic>Design optimization</topic><topic>Filtering</topic><topic>Fluctuations</topic><topic>Predictive models</topic><topic>Statistical analysis</topic><topic>US Department of Energy</topic><toplevel>online_resources</toplevel><creatorcontrib>Le Carval, G.</creatorcontrib><creatorcontrib>Scheiblin, P.</creatorcontrib><creatorcontrib>Poncet, D.</creatorcontrib><creatorcontrib>Rivallin, P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Le Carval, G.</au><au>Scheiblin, P.</au><au>Poncet, D.</au><au>Rivallin, P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Methodology for predictive calibration of TCAD simulators</atitle><btitle>SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest</btitle><stitle>SISPAD</stitle><date>1997</date><risdate>1997</risdate><spage>177</spage><epage>180</epage><pages>177-180</pages><isbn>9780780337756</isbn><isbn>0780337751</isbn><abstract>This paper presents an original methodology for calibrating Technology Computer-Aided Design (TCAD) simulators. This approach associates physical analysis of models, statistical analysis of data, and systematic use of Design of Experiments. This new concept, inspired by the Taguchi's methodology, allows to minimise the difference between simulations and measurements while being the less sensitive to the fluctuations of the manufacturing process. The methodology fits well with economic constraints by only using the existing data, and by reusing previous calibration works.</abstract><pub>IEEE</pub><doi>10.1109/SISPAD.1997.621366</doi><tpages>4</tpages></addata></record> |
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identifier | ISBN: 9780780337756 |
ispartof | SISPAD '97. 1997 International Conference on Simulation of Semiconductor Processes and Devices. Technical Digest, 1997, p.177-180 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Analytical models Calibration Computational modeling Computer simulation Design optimization Filtering Fluctuations Predictive models Statistical analysis US Department of Energy |
title | Methodology for predictive calibration of TCAD simulators |
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