OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters

This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pas...

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Bibliographic Details
Main Authors: Arbet, D., Gyepes, G., Brenkus, J., Stopjakova, V.
Format: Conference Proceeding
Language:English
Subjects:
catastrophic faults
Circuit faults
fault detection
Low pass filters
mixed-signal test
Monitoring
Oscillation-based Build-In Self Test
Oscillators
parametric test
Radiation detectors
System-on-a-chip
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Summary:This paper deals with the comparison of the fault coverage of catastrophic faults in active analog integrated filter obtained by the measurement of filter parameters and by the Oscillation-based Built-In Self Test (OBIST) approach. In our experiment, firstly, the cut-off frequency, ripple in the pass band, DC gain in pass band and group delay of the filters have been monitored in the operating mode. Then, during the test mode (OBIST), the filter is transformed to an oscillator, and the oscillation frequency is compared to the frequency from a dedicated on-chip reference oscillator to compensate undesired influence of technology variations. The obtained results on the efficiency of both approaches are compared.
DOI:10.1109/DDECS.2012.6219053