Test generator with preselected toggling for low power built-in self-test

This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this...

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Bibliographic Details
Main Authors: Rajski, J., Tyszer, J., Mrugalski, G., Nadeau-Dostie, B.
Format: Conference Proceeding
Language:English
Subjects:
Built-in self-test
Circuit faults
Generators
Latches
Logic gates
Shift registers
Switches
Online Access:Request full text
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Description
Summary:This paper presents a new pseudorandom test pattern generator with preselected toggling (PRESTO) activity. It is comprised of a linear finite state machine (a linear feedback shift register or a ring generator) driving an appropriate phase shifter and armed with a number of features that allows this device to produce binary sequences with low toggling (switching) rates while preserving test coverage achievable by the best-to-date conventional BIST-based PRPGs with negligible impact on test application time.
ISSN:1093-0167
2375-1053
DOI:10.1109/VTS.2012.6231071