Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs

This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator...

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Bibliographic Details
Main Authors: SangKeun Kwak, JeongMin Jo, SeokSoon Noh, HyeSook Lee, Wansoo Nah, SoYoung Kim
Format: Conference Proceeding
Language:English
Subjects:
Capacitors
Energy management
Generators
Immunity testing
Integrated circuit modeling
Radio frequency
Online Access:Request full text
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Description
Summary:This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor.
ISSN:2162-7673
2640-7469
DOI:10.1109/APEMC.2012.6237908