The amplitude of random telegraph noise: Scaling implications

We introduce a simple and intuitive model to relate the amplitude of random telegraph noise (RTN) fluctuations to the columbic influence of single trap charges on the inversion layer. The prediction of this model is in excellent agreement with results extracted from experiment using the "hole-i...

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Bibliographic Details
Main Authors: Cheung, Kin P., Campbell, J. P., Potbhare, S., Oates, A.
Format: Conference Proceeding
Language:English
Subjects:
Dielectrics
Fluctuations
Logic gates
Mathematical model
Noise
Semiconductor device modeling
Semiconductor process modeling
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Summary:We introduce a simple and intuitive model to relate the amplitude of random telegraph noise (RTN) fluctuations to the columbic influence of single trap charges on the inversion layer. The prediction of this model is in excellent agreement with results extracted from experiment using the "hole-in-the-inversion-layer" model for RTN amplitude. This new model allows us to quantitatively examine the impact of "worst-case" RTN in future scaling nodes.
ISSN:1541-7026
1938-1891
DOI:10.1109/IRPS.2012.6241908