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A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC-40-GHz Applications
This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN o...
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Published in: | IEEE transactions on microwave theory and techniques 2012-10, Vol.60 (10), p.3096-3112 |
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container_title | IEEE transactions on microwave theory and techniques |
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creator | Patel, C. D. Rebeiz, G. M. |
description | This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN of contact force (per contact) from 80 to 90 V and 1.0 mN of restoring force (per contact). The up-state capacitance is 8 fF, resulting in an isolation of 46, 31, and 14 dB at 1, 6, and 40 GHz, respectively. Measured results show switch resistances of 1-2 Ω and a reliability of >; 100 million cycles at 2-5 W under cold switching at 100 mW under hot-switching conditions, in an unpackaged and standard laboratory environment. Furthermore, the device was tested under prolonged hold-down conditions and demonstrated excellent RF power handling (>;10 W) and dc current handling (>;1 A) capability. |
doi_str_mv | 10.1109/TMTT.2012.2211888 |
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D. ; Rebeiz, G. M.</creator><creatorcontrib>Patel, C. D. ; Rebeiz, G. M.</creatorcontrib><description>This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN of contact force (per contact) from 80 to 90 V and 1.0 mN of restoring force (per contact). The up-state capacitance is 8 fF, resulting in an isolation of 46, 31, and 14 dB at 1, 6, and 40 GHz, respectively. Measured results show switch resistances of 1-2 Ω and a reliability of >; 100 million cycles at 2-5 W under cold switching at 100 mW under hot-switching conditions, in an unpackaged and standard laboratory environment. Furthermore, the device was tested under prolonged hold-down conditions and demonstrated excellent RF power handling (>;10 W) and dc current handling (>;1 A) capability.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2012.2211888</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuit properties ; Contact ; Contact stresses ; Contact switch ; Contacts ; Devices ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; electrostatic relay ; Exact sciences and technology ; Force ; gradient insensitive ; Handling ; hard metal contact ; high contact force ; Manganese ; Materials handling ; Micro- and nanoelectromechanical devices (mems/nems) ; Microelectromechanical systems ; Micromechanical devices ; Radio frequencies ; Radio frequency ; Renovating ; RF microelectromechanical systems (MEMS) ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Stress ; stress insensitive ; Studies ; Switches ; Switching, multiplexing, switched capacity circuits ; Temperature effects</subject><ispartof>IEEE transactions on microwave theory and techniques, 2012-10, Vol.60 (10), p.3096-3112</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c404t-c2b9d465939e719b584e19bd77f622c45a558879bb34249f06fa0c75e6e771fa3</citedby><cites>FETCH-LOGICAL-c404t-c2b9d465939e719b584e19bd77f622c45a558879bb34249f06fa0c75e6e771fa3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6293922$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,54796</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26442960$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Patel, C. D.</creatorcontrib><creatorcontrib>Rebeiz, G. M.</creatorcontrib><title>A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC-40-GHz Applications</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN of contact force (per contact) from 80 to 90 V and 1.0 mN of restoring force (per contact). The up-state capacitance is 8 fF, resulting in an isolation of 46, 31, and 14 dB at 1, 6, and 40 GHz, respectively. Measured results show switch resistances of 1-2 Ω and a reliability of >; 100 million cycles at 2-5 W under cold switching at 100 mW under hot-switching conditions, in an unpackaged and standard laboratory environment. Furthermore, the device was tested under prolonged hold-down conditions and demonstrated excellent RF power handling (>;10 W) and dc current handling (>;1 A) capability.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Contact</subject><subject>Contact stresses</subject><subject>Contact switch</subject><subject>Contacts</subject><subject>Devices</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>electrostatic relay</subject><subject>Exact sciences and technology</subject><subject>Force</subject><subject>gradient insensitive</subject><subject>Handling</subject><subject>hard metal contact</subject><subject>high contact force</subject><subject>Manganese</subject><subject>Materials handling</subject><subject>Micro- and nanoelectromechanical devices (mems/nems)</subject><subject>Microelectromechanical systems</subject><subject>Micromechanical devices</subject><subject>Radio frequencies</subject><subject>Radio frequency</subject><subject>Renovating</subject><subject>RF microelectromechanical systems (MEMS)</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Stress</subject><subject>stress insensitive</subject><subject>Studies</subject><subject>Switches</subject><subject>Switching, multiplexing, switched capacity circuits</subject><subject>Temperature effects</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNpdkE1LAzEQhoMoWKs_QLwsiOAlNcnm81hqP4QWpa3nJZtmbcq6uyZbSv31prT04OllZp55mXkBuMeohzFSL8vZctkjCJMeIRhLKS9ABzMmoOICXYIOQlhCRSW6BjchbGJJGZIdsOonE_e1hnNbOp270rX7Y2PqKqv9ufyod9Yn81EyG84Wycy2uoSDumq1aZPFzrVmnRS1T14HkCI4nvwm_aYpndGtq6twC64KXQZ7d9Iu-BwNl4MJnL6P3wb9KTQU0RYakqsV5UylygqsciapjbISouCEGMo0Y1IKlecpJVQViBcaGcEst0LgQqdd8Hz0bXz9s7Whzb5dMLYsdWXrbchwyhlmQhEW0cd_6Kbe-ipel2EkCeZSCBIpfKSMr0Pwtsga776130coO-SeHXLPDrlnp9zjztPJWQejy8LryrhwXiScUqI4itzDkXPW2vOYk_g9IekfoDmIQA</recordid><startdate>20121001</startdate><enddate>20121001</enddate><creator>Patel, C. D.</creator><creator>Rebeiz, G. M.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20121001</creationdate><title>A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC-40-GHz Applications</title><author>Patel, C. D. ; Rebeiz, G. M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c404t-c2b9d465939e719b584e19bd77f622c45a558879bb34249f06fa0c75e6e771fa3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Contact</topic><topic>Contact stresses</topic><topic>Contact switch</topic><topic>Contacts</topic><topic>Devices</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>electrostatic relay</topic><topic>Exact sciences and technology</topic><topic>Force</topic><topic>gradient insensitive</topic><topic>Handling</topic><topic>hard metal contact</topic><topic>high contact force</topic><topic>Manganese</topic><topic>Materials handling</topic><topic>Micro- and nanoelectromechanical devices (mems/nems)</topic><topic>Microelectromechanical systems</topic><topic>Micromechanical devices</topic><topic>Radio frequencies</topic><topic>Radio frequency</topic><topic>Renovating</topic><topic>RF microelectromechanical systems (MEMS)</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Stress</topic><topic>stress insensitive</topic><topic>Studies</topic><topic>Switches</topic><topic>Switching, multiplexing, switched capacity circuits</topic><topic>Temperature effects</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Patel, C. D.</creatorcontrib><creatorcontrib>Rebeiz, G. M.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library Online</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Patel, C. D.</au><au>Rebeiz, G. M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC-40-GHz Applications</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2012-10-01</date><risdate>2012</risdate><volume>60</volume><issue>10</issue><spage>3096</spage><epage>3112</epage><pages>3096-3112</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN of contact force (per contact) from 80 to 90 V and 1.0 mN of restoring force (per contact). The up-state capacitance is 8 fF, resulting in an isolation of 46, 31, and 14 dB at 1, 6, and 40 GHz, respectively. Measured results show switch resistances of 1-2 Ω and a reliability of >; 100 million cycles at 2-5 W under cold switching at 100 mW under hot-switching conditions, in an unpackaged and standard laboratory environment. Furthermore, the device was tested under prolonged hold-down conditions and demonstrated excellent RF power handling (>;10 W) and dc current handling (>;1 A) capability.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TMTT.2012.2211888</doi><tpages>17</tpages></addata></record> |
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subjects | Applied sciences Circuit properties Contact Contact stresses Contact switch Contacts Devices Electric, optical and optoelectronic circuits Electronic circuits Electronics electrostatic relay Exact sciences and technology Force gradient insensitive Handling hard metal contact high contact force Manganese Materials handling Micro- and nanoelectromechanical devices (mems/nems) Microelectromechanical systems Micromechanical devices Radio frequencies Radio frequency Renovating RF microelectromechanical systems (MEMS) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Stress stress insensitive Studies Switches Switching, multiplexing, switched capacity circuits Temperature effects |
title | A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC-40-GHz Applications |
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