Determination of the quantized hall resistance value by using a calculable capacitor at ETL

We report the International System (SI) value of the quantized Hall resistance (R H ) determined by using a calculable capacitor at the electrotechnical laboratory (ETL). As the result of our measurements at ETL, a most reliable value of h / e 2 has been estimated as 25 812.8036 Ω SI with a systemat...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1987-06, Vol.IM-36 (2), p.214-217
Main Authors: Shida, Katsunori, Wada, Toshimi, Nishinaka, Hidefumi, Kobayashi, Minoru, Yonezaki, Genta, Igarashi, Takashi, Nemoto, Toshio
Format: Article
Language:English
Subjects:
Capacitors
Electrical resistance measurement
Resistance
Resistors
Silicon
Temperature measurement
Uncertainty
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Summary:We report the International System (SI) value of the quantized Hall resistance (R H ) determined by using a calculable capacitor at the electrotechnical laboratory (ETL). As the result of our measurements at ETL, a most reliable value of h / e 2 has been estimated as 25 812.8036 Ω SI with a systematic uncertainty of 0.25 ppm root sum square (rss) and a random error of 0.20 ppm one standard deviation (1σ).
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.1987.6312671