Investigation of frequency dependents of Contactless Control Microstrip Line on Semiconductor Substrate

In this paper we give the structures of Contact-less Control Microstrip Line on Semiconductor Substrate (CCMLSS). Parameters and characteristics of CCMLSS have changes under the influence of potential applied to a special control plate. This plate is located above the CCMLSS and has some potential r...

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Bibliographic Details
Main Authors: Kopylov, A. F., Kopylova, N. A.
Format: Conference Proceeding
Language:English
Subjects:
Electric potential
Frequency control
Gallium arsenide
Microstrip
Ohmic contacts
Strips
Substrates
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Summary:In this paper we give the structures of Contact-less Control Microstrip Line on Semiconductor Substrate (CCMLSS). Parameters and characteristics of CCMLSS have changes under the influence of potential applied to a special control plate. This plate is located above the CCMLSS and has some potential relative to the line common ground. There are equivalent circuits of CCMLSS and results of numerical simulation of Amplitude-Frequency Characteristics (AFC) and Phase-Frequency Characteristics (PFC) for zero and maximum control potential. AFC is ratio transmission power modulus (RTPM) and PFC is phase of ratio transmission power (RTPP) of CCMLSS.