Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center

Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-des...

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Published in:IEEE transactions on nuclear science 2012-12, Vol.59 (6), p.3154-3159
Main Authors: Cascio, E. W., Riley, K. J., McCormack, J., Flanagan, R.
Format: Article
Language:English
Subjects:
Fuel consumption
MOSFETs
Neutron radiation effects
Nondestructive testing
Nuclear power generation
Power MOSFET
power MOSFETs
Protons
Radiation effects
Real time
single event burnout
Single Event Effects
Therapy
X-rays
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cited_by cdi_FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713
cites cdi_FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713
container_end_page 3159
container_issue 6
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container_title IEEE transactions on nuclear science
container_volume 59
creator Cascio, E. W.
Riley, K. J.
McCormack, J.
Flanagan, R.
description Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-destructive testing of multiple MOSFETs in parallel for in situ real time measurements.
doi_str_mv 10.1109/TNS.2012.2221741
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fullrecord <record><control><sourceid>proquest_ieee_</sourceid><recordid>TN_cdi_ieee_primary_6365390</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6365390</ieee_id><sourcerecordid>2869271101</sourcerecordid><originalsourceid>FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713</originalsourceid><addsrcrecordid>eNpdkE1LAzEQhoMoWKt3wUvAi5etmXw0m6PU-gFVC63nENJZXWk3Ndmt9N-b0uLB0zCT530JDyGXwAYAzNzOX2cDzoAPOOegJRyRHihVFqB0eUx6jEFZGGnMKTlL6SuvUjHVI_Wsbj6WSMcbbFo6rir0baJ1Q6fhByN9eZs9jOeJ3ndI20DbT6Qz9KFZuLilr9i1MTR03GzqPFe7hpx0dBpDm-_zT4xuvaWj_IDxnJxUbpnw4jD75D1Xj56Kydvj8-huUnjBZVt4MMogc45zhIUREqURC6eZd1BKyUtdmSFboOLae4FlqZTmrkJ0HoXUIPrkZt-7juG7w9TaVZ08LpeuwdAlCwLU0DAmZUav_6FfoYtN_p0FrlmpmTA8U2xP-RhSiljZdaxXWYAFZnfubXZvd-7twX2OXO0jNSL-4UMxVMIw8Qv5On5-</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1270870392</pqid></control><display><type>article</type><title>Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Cascio, E. W. ; Riley, K. J. ; McCormack, J. ; Flanagan, R.</creator><creatorcontrib>Cascio, E. W. ; Riley, K. J. ; McCormack, J. ; Flanagan, R.</creatorcontrib><description>Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-destructive testing of multiple MOSFETs in parallel for in situ real time measurements.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2012.2221741</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Fuel consumption ; MOSFETs ; Neutron radiation effects ; Nondestructive testing ; Nuclear power generation ; Power MOSFET ; power MOSFETs ; Protons ; Radiation effects ; Real time ; single event burnout ; Single Event Effects ; Therapy ; X-rays</subject><ispartof>IEEE transactions on nuclear science, 2012-12, Vol.59 (6), p.3154-3159</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Dec 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713</citedby><cites>FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6365390$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,54774</link.rule.ids></links><search><creatorcontrib>Cascio, E. W.</creatorcontrib><creatorcontrib>Riley, K. J.</creatorcontrib><creatorcontrib>McCormack, J.</creatorcontrib><creatorcontrib>Flanagan, R.</creatorcontrib><title>Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-destructive testing of multiple MOSFETs in parallel for in situ real time measurements.</description><subject>Fuel consumption</subject><subject>MOSFETs</subject><subject>Neutron radiation effects</subject><subject>Nondestructive testing</subject><subject>Nuclear power generation</subject><subject>Power MOSFET</subject><subject>power MOSFETs</subject><subject>Protons</subject><subject>Radiation effects</subject><subject>Real time</subject><subject>single event burnout</subject><subject>Single Event Effects</subject><subject>Therapy</subject><subject>X-rays</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNpdkE1LAzEQhoMoWKt3wUvAi5etmXw0m6PU-gFVC63nENJZXWk3Ndmt9N-b0uLB0zCT530JDyGXwAYAzNzOX2cDzoAPOOegJRyRHihVFqB0eUx6jEFZGGnMKTlL6SuvUjHVI_Wsbj6WSMcbbFo6rir0baJ1Q6fhByN9eZs9jOeJ3ndI20DbT6Qz9KFZuLilr9i1MTR03GzqPFe7hpx0dBpDm-_zT4xuvaWj_IDxnJxUbpnw4jD75D1Xj56Kydvj8-huUnjBZVt4MMogc45zhIUREqURC6eZd1BKyUtdmSFboOLae4FlqZTmrkJ0HoXUIPrkZt-7juG7w9TaVZ08LpeuwdAlCwLU0DAmZUav_6FfoYtN_p0FrlmpmTA8U2xP-RhSiljZdaxXWYAFZnfubXZvd-7twX2OXO0jNSL-4UMxVMIw8Qv5On5-</recordid><startdate>20121201</startdate><enddate>20121201</enddate><creator>Cascio, E. W.</creator><creator>Riley, K. J.</creator><creator>McCormack, J.</creator><creator>Flanagan, R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>20121201</creationdate><title>Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center</title><author>Cascio, E. W. ; Riley, K. J. ; McCormack, J. ; Flanagan, R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Fuel consumption</topic><topic>MOSFETs</topic><topic>Neutron radiation effects</topic><topic>Nondestructive testing</topic><topic>Nuclear power generation</topic><topic>Power MOSFET</topic><topic>power MOSFETs</topic><topic>Protons</topic><topic>Radiation effects</topic><topic>Real time</topic><topic>single event burnout</topic><topic>Single Event Effects</topic><topic>Therapy</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cascio, E. W.</creatorcontrib><creatorcontrib>Riley, K. J.</creatorcontrib><creatorcontrib>McCormack, J.</creatorcontrib><creatorcontrib>Flanagan, R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE/IET Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Cascio, E. W.</au><au>Riley, K. J.</au><au>McCormack, J.</au><au>Flanagan, R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2012-12-01</date><risdate>2012</risdate><volume>59</volume><issue>6</issue><spage>3154</spage><epage>3159</epage><pages>3154-3159</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Secondary neutron induced single event burnouts (SEB) in power MOSFETs to be installed in an X-ray generator located in a proton therapy treatment vault are characterized. This is done using both accelerated and in situ testing. Experimental techniques and schematics are presented that allow non-destructive testing of multiple MOSFETs in parallel for in situ real time measurements.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2012.2221741</doi><tpages>6</tpages></addata></record>
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source IEEE Electronic Library (IEL) Journals
subjects Fuel consumption
MOSFETs
Neutron radiation effects
Nondestructive testing
Nuclear power generation
Power MOSFET
power MOSFETs
Protons
Radiation effects
Real time
single event burnout
Single Event Effects
Therapy
X-rays
title Single Event Effects in Power MOSFETs Due to the Secondary Neutron Environment in a Proton Therapy Center
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T01%3A59%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Single%20Event%20Effects%20in%20Power%20MOSFETs%20Due%20to%20the%20Secondary%20Neutron%20Environment%20in%20a%20Proton%20Therapy%20Center&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Cascio,%20E.%20W.&rft.date=2012-12-01&rft.volume=59&rft.issue=6&rft.spage=3154&rft.epage=3159&rft.pages=3154-3159&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2012.2221741&rft_dat=%3Cproquest_ieee_%3E2869271101%3C/proquest_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c324t-c1959e0aa22e1d934e493da70ca1844287f960de527cc3e885572afeeace34713%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1270870392&rft_id=info:pmid/&rft_ieee_id=6365390&rfr_iscdi=true