An IEEE 1149.1 based test access architecture for ICs with embedded cores

This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores.

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Bibliographic Details
Main Author: Whetsel, L.
Format: Conference Proceeding
Language:English
Subjects:
Built-in self-test
Circuit testing
Clocks
Emulation
Instruments
Integral equations
Integrated circuit testing
Pins
Registers
System testing
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Description
Summary:This paper describes work at Texas Instruments regarding development of an IC architecture supporting hierarchical test access of embedded cores.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1997.639596