Complex near electromagnetic field scanning on printed circuit board

In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which co...

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Bibliographic Details
Main Authors: Fengchao Xiao, Takatsu, T., Murano, K., Kami, Y.
Format: Conference Proceeding
Language:English
Subjects:
6-port network
Impedance
Magnetic field measurement
near EM-field
Phase measurement
Power measurement
Probes
Quadrature hybrid
Voltage measurement
Online Access:Request full text
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Description
Summary:In this paper, a new measurement system for scanning the complex near field on a printed circuit board (PCB) is proposed. The measurement is based on the 6-port technique. The measurement results of the proposed measurement system and the measured results directly by using a VNA agree well, which confirmed the validity of the proposed measurement system.
ISSN:2325-0356
DOI:10.1109/EMCEurope.2012.6396675