A unified interface for scan test generation based on STIL

The Standard Test Interface Language (STIL) was developed for universal pattern interchange form test generation tools output to tester input. We extend the usage of STIL to the various input files of a test generation tool we developed, thus using one language where traditional test tools use five...

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Bibliographic Details
Main Authors: Wohl, P., Waicukauski, J.
Format: Conference Proceeding
Language:English
Subjects:
Automatic test pattern generation
Automatic testing
Design automation
Hardware design languages
Integrated circuit testing
Libraries
Maintenance engineering
Test equipment
Test pattern generators
Timing
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Description
Summary:The Standard Test Interface Language (STIL) was developed for universal pattern interchange form test generation tools output to tester input. We extend the usage of STIL to the various input files of a test generation tool we developed, thus using one language where traditional test tools use five or more. This significantly reduces engineering time to learn the required languages, create and maintain all files. The output STIL file generated contains the information from ail input files, eliminating the confusion often caused by managing multiple versions of multiple files. Users can start with only a minimal input file, have the tool fill in defaults, and write out a complete STIL file. This file can be modified and read back in as any of the input files, allowing stepwise refinements.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.1997.639718