On-die instrumentation to solve challenges for 28nm, 28Gbps timing variability and stressing

Moving to the latest submicron node is required for digital scaling but causes many challenges for analog design. Additionally, scaling pushes the need for higher bandwidth. Data rates up to 28Gbps require effectively dealing with random variations and layout dependent effects. On-die instrumentatio...

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Bibliographic Details
Main Authors: Weichi Ding, Mingde Pan, Wong, W., Chow, D., Li, M. P., Shumarayev, S.
Format: Conference Proceeding
Language:English
Subjects:
Calibration
Clocks
Jitter
Receivers
Transistors
Transmitters
Voltage-controlled oscillators
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Summary:Moving to the latest submicron node is required for digital scaling but causes many challenges for analog design. Additionally, scaling pushes the need for higher bandwidth. Data rates up to 28Gbps require effectively dealing with random variations and layout dependent effects. On-die instrumentation (ODI) is an effective means to alleviate many of the challenges, as well as characterize and margin performance. This paper covers two of the ODI techniques used in the design of a wide range 28nm, 28Gbps transceiver.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2012.6401536