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High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C
This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. The minimum operating voltage is 2V and consumes m...
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creator | Pathrose, J. Xiaohui Gong Lei Zou Jeongwook Koh Chai, K. T. C. Minkyu Je Yong Ping Xu |
description | This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. The minimum operating voltage is 2V and consumes merely 285μW at room temperature over several samples. |
doi_str_mv | 10.1109/RFIT.2012.6401630 |
format | conference_proceeding |
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T. C. ; Minkyu Je ; Yong Ping Xu</creator><creatorcontrib>Pathrose, J. ; Xiaohui Gong ; Lei Zou ; Jeongwook Koh ; Chai, K. T. C. ; Minkyu Je ; Yong Ping Xu</creatorcontrib><description>This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. 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The minimum operating voltage is 2V and consumes merely 285μW at room temperature over several samples.</description><subject>Bandgap Reference</subject><subject>Gain</subject><subject>High Temperature</subject><subject>Op-amp Offset</subject><subject>Photonic band gap</subject><subject>Resistors</subject><subject>SOI</subject><subject>Temperature Compensation</subject><subject>Temperature dependence</subject><subject>Temperature distribution</subject><subject>Temperature measurement</subject><subject>Voltage measurement</subject><isbn>9781467323031</isbn><isbn>1467323039</isbn><isbn>1467323047</isbn><isbn>9781467323055</isbn><isbn>1467323055</isbn><isbn>9781467323048</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2012</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpVkEFOwzAURI0QElByAMTGF0j433bseokCpZGKgmgW7Con_kmNaBqlqRC34gycDARlwWr0pHmzGMYuERJEsNdPs7xMBKBItALUEo7YOSptpJCgzDGLrJn-scRTFu12LwDw7Wor4Iw9z0O75iNtehrcuB-IV67zrev5QA0N1NXEQ8cfb5dFzrOHYsnfwrjm25966Np_6r7n45ZLgM-P7IKdNO51R9EhJ6yc3ZXZPF4U93l2s4iDhTH2lfPKmUaArLVOtfLoa42VNjadeqEQdW2hcoSySUGSaWpUqnEq9WCUSOWEXf3OBiJa9UPYuOF9dfhCfgFmUVHA</recordid><startdate>201211</startdate><enddate>201211</enddate><creator>Pathrose, J.</creator><creator>Xiaohui Gong</creator><creator>Lei Zou</creator><creator>Jeongwook Koh</creator><creator>Chai, K. T. C.</creator><creator>Minkyu Je</creator><creator>Yong Ping Xu</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>201211</creationdate><title>High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C</title><author>Pathrose, J. ; Xiaohui Gong ; Lei Zou ; Jeongwook Koh ; Chai, K. T. 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C.</creatorcontrib><creatorcontrib>Minkyu Je</creatorcontrib><creatorcontrib>Yong Ping Xu</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Pathrose, J.</au><au>Xiaohui Gong</au><au>Lei Zou</au><au>Jeongwook Koh</au><au>Chai, K. T. C.</au><au>Minkyu Je</au><au>Yong Ping Xu</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C</atitle><btitle>2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)</btitle><stitle>RFIT</stitle><date>2012-11</date><risdate>2012</risdate><spage>110</spage><epage>112</epage><pages>110-112</pages><isbn>9781467323031</isbn><isbn>1467323039</isbn><eisbn>1467323047</eisbn><eisbn>9781467323055</eisbn><eisbn>1467323055</eisbn><eisbn>9781467323048</eisbn><abstract>This paper describes a bandgap reference with temperature range up to 300°C. Fabricated in a PDSOI CMOS technology, the bandgap reference achieves a box model temperature coefficient of 138ppm from 25 to 300°C, and line regulation less than 1.5mv/V. The minimum operating voltage is 2V and consumes merely 285μW at room temperature over several samples.</abstract><pub>IEEE</pub><doi>10.1109/RFIT.2012.6401630</doi><tpages>3</tpages></addata></record> |
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ispartof | 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT), 2012, p.110-112 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Bandgap Reference Gain High Temperature Op-amp Offset Photonic band gap Resistors SOI Temperature Compensation Temperature dependence Temperature distribution Temperature measurement Voltage measurement |
title | High temperature bandgap reference in PDSOI CMOS with operating temperature up to 300°C |
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