Measurement of chirp in semiconductor lasers using interferometric intensity noise

Frequency chirp in semiconductor lasers is a critical physical parameter for both analog and digital communications system performance. Here we describe a method for measuring chirp which uses the interferometric properties of standard fiber instead of a separate interferometer.

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Bibliographic Details
Main Authors: Sheridan-Eng, J., Shtengel, G.E., Kazarinov, R.E.
Format: Conference Proceeding
Language:English
Subjects:
Chirp modulation
Fiber lasers
Frequency modulation
Laser noise
Noise measurement
Optical fibers
Optical interferometry
Optical noise
Semiconductor device noise
Semiconductor lasers
Online Access:Request full text
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Description
Summary:Frequency chirp in semiconductor lasers is a critical physical parameter for both analog and digital communications system performance. Here we describe a method for measuring chirp which uses the interferometric properties of standard fiber instead of a separate interferometer.
ISSN:1092-8081
2766-1733
DOI:10.1109/LEOS.1997.645371